Editors:
Part of the book series: Communications in Computer and Information Science (CCIS, volume 892)
Conference series link(s): VDAT: International Symposium on VLSI Design and Test
Conference proceedings info: VDAT 2018.
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Table of contents (58 papers)
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Front Matter
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Digital Design
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Front Matter
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Analog and Mixed Signal Design
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Front Matter
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About this book
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Editors and Affiliations
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Thiagarajar College of Engineering, Madurai, India
S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani
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Indian Institute of Technology Bombay, Mumbai, India
Virendra Singh
Bibliographic Information
Book Title: VLSI Design and Test
Book Subtitle: 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Editors: S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh
Series Title: Communications in Computer and Information Science
DOI: https://doi.org/10.1007/978-981-13-5950-7
Publisher: Springer Singapore
eBook Packages: Computer Science, Computer Science (R0)
Copyright Information: Springer Nature Singapore Pte Ltd. 2019
Softcover ISBN: 978-981-13-5949-1Published: 25 January 2019
eBook ISBN: 978-981-13-5950-7Published: 24 January 2019
Series ISSN: 1865-0929
Series E-ISSN: 1865-0937
Edition Number: 1
Number of Pages: XVIII, 722
Number of Illustrations: 387 b/w illustrations, 324 illustrations in colour
Topics: Computer Hardware