Overview
- Proposes a top-down EMC quantification design method for the prediction and analysis of system-level EMC
- Provides indicators to quantitatively evaluate the performance of system’s EMC
- Describes eight categories of EMC design indicators and four categories of experimental indicators
- Offers a modeling method for EMC of complex systems or systems with incomplete design parameters
- Presents evaluation and quality control methods for EMC based on expert system
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Table of contents (8 chapters)
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Electromagnetic Compatibility Fundamental Theories
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Methods and Applications of Quantitative System-Level EMC Design
Keywords
About this book
It enables readers to obtain a thorough understanding of the theory and methods of system-level electromagnetic compatibility quantification design as well as the methodologies for engineering practice.
Authors and Affiliations
About the authors
Shuguo Xie, received his Ph.D. degree in Radio Physics from Wuhan University in 2001. He is currently a professor and the dean of Electronic Science and TechnologyDepartment, School of Electronic and Information Engineering, Beihang University. He has published more than 80 papers, 2 books and 28 authorized patents. He is the member of the special committee for the complex radiation field of China Ordnance Society, the special committee for electromagnetic spectrum of Communication and Control Society. Prof. Xie is the recipient of two State Scientific and Technological Progress Awards (2nd Grade), two First Class Prize of The National Defense Science and Technology Progress Award and one First Class Prize of Defense Technology Invention Award. His research area includes evaluation and design of EMC for complex system, EMC modeling of electronic equipment, imaging and locating of EMI, testing method and testing system of EMC, radio propagation, antenna and radar signal processing.
Fei Dai, received his bachelor degree in Test Technology and Instrumentation from Anhui University of Technology in 1999, and the Ph.D. degree in Circuits and Systems from Beihang University in 2007. He is currently an associate professor in School of Electronic and Information Engineering, Beihang University. He has published more than 70 papers and 50 patents. He is the recipient of National Natural Science Foundation of China, from 2015 to 2019 under the topic of the mechanism and test methods of hazards of electromagnetic radiation to fuel. He was awarded State Scientific and Technological Progress Award (2nd Grade) in 2012. His research interests are system level EMC simulation and EMC testing technology.
Yan Liu, received his bachelor and master degree from Air Force Engineering University, China, in 1996 and 2003. He received his Ph.D. degree in School of Electronic and Information Engineering from Beihang University, Beijing, China, in 2008. He is currently working in BUAA EMC Technology Institute. He is the recipient of The National Defense Science and Technology Progress Award (1st Grade, List 4th) in 2010, The National Defense Science and Technology Progress Award (1st Grade, List 12th) in 2011, and Defense Technology Invention Award (2nd Grade, List 4th) in 2014. His research interests lie in electromagnetic environment effect, EMC Design and Evaluation, EMC Testing Technology, radio propagation and radar signal processing.
Yunfeng Jia, received the B.Eng., M.Eng. and Ph.D. degrees, all in Applied Physics from National University of Defense Technology, China. He is currently a senior engineer in School of Electronics and Information Engineering, Beihang University, Beijing, China. He has published more than 20 publications, and received Second Prize in National Defense Invention Award, 2014. He hosts more than 20 projects including National Natural Science Foundation of China, Pre-research: Simulation and prediction of electromagnetic compatibility of complex system, Aviation Science Fund and so on. His research interests include simulation, prediction, design and evaluation of EMC of Helicopters.Bibliographic Information
Book Title: Theory and Methods of Quantification Design on System-Level Electromagnetic Compatibility
Authors: Donglin Su, Shuguo Xie, Fei Dai, Yan Liu, Yunfeng Jia
DOI: https://doi.org/10.1007/978-981-13-3690-4
Publisher: Springer Singapore
eBook Packages: Engineering, Engineering (R0)
Copyright Information: National Defense Industry Press and Springer Nature Singapore Pte Ltd. 2019
Hardcover ISBN: 978-981-13-3689-8Published: 21 March 2019
eBook ISBN: 978-981-13-3690-4Published: 05 March 2019
Edition Number: 1
Number of Pages: XVII, 346
Number of Illustrations: 82 b/w illustrations, 123 illustrations in colour
Additional Information: Jointly published with National Defense Industry Press, Beijing, China
Topics: Microwaves, RF and Optical Engineering, Circuits and Systems, Electronic Circuits and Devices, Classical Electrodynamics