Authors:
- First book to address the effect of device reliability and process variations on the RF circuit performance degradations
- Present of all kinds RF circuits in the reliability examination
- Includes analytical equations, experimental data and simulation results
- Includes supplementary material: sn.pub/extras
Part of the book series: SpringerBriefs in Applied Sciences and Technology (BRIEFSAPPLSCIENCES)
Part of the book sub series: SpringerBriefs in Reliability (SBR)
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Table of contents (10 chapters)
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Front Matter
About this book
Authors and Affiliations
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Electrical Engineering and Comp Sci, University of Central Florida, Orlando, USA
Jiann-Shiun Yuan
Bibliographic Information
Book Title: CMOS RF Circuit Design for Reliability and Variability
Authors: Jiann-Shiun Yuan
Series Title: SpringerBriefs in Applied Sciences and Technology
DOI: https://doi.org/10.1007/978-981-10-0884-9
Publisher: Springer Singapore
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Author(s) 2016
Softcover ISBN: 978-981-10-0882-5Published: 21 April 2016
eBook ISBN: 978-981-10-0884-9Published: 13 April 2016
Series ISSN: 2191-530X
Series E-ISSN: 2191-5318
Edition Number: 1
Number of Pages: VI, 106
Number of Illustrations: 101 b/w illustrations
Topics: Circuits and Systems, Electronic Circuits and Devices, Microwaves, RF and Optical Engineering