Overview
- Presents the new developments as well as many novel electromagnetic testing methods
- Covers both theoretical research and engineering applications in the field
- Includes several interdisciplinary topics between applied physics and engineering
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Measurement Science and Technology (SSMST)
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Table of contents (6 chapters)
Keywords
About this book
This book introduces novel developments in the field of electromagnetic non-destructive testing and evaluation (NDT/E). The topics include electromagnetic ultrasonic guided wave testing, pulsed eddy current testing, remote field eddy current testing, low frequency eddy current testing, metal magnetic memory testing, and magnetic flux leakage testing. Considering the increasing concern about the safety maintenance of critical structures in various industries and everyday life, these topics presented here will be of particular interest to the readers in the NDT/E field. This book covers both theoretical researches and the engineering applications of the electromagnetic NDT technology. It could serve as a valuable reference for college students and relevant NDT technicians. It is also a useful material for qualification training and higher learning for nondestructive testing professionals.
Authors and Affiliations
Bibliographic Information
Book Title: New Technologies in Electromagnetic Non-destructive Testing
Authors: Songling Huang, Shen Wang
Series Title: Springer Series in Measurement Science and Technology
DOI: https://doi.org/10.1007/978-981-10-0578-7
Publisher: Springer Singapore
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd. 2016
Hardcover ISBN: 978-981-10-0577-0Published: 16 March 2016
Softcover ISBN: 978-981-10-9199-5Published: 25 April 2018
eBook ISBN: 978-981-10-0578-7Published: 05 March 2016
Series ISSN: 2198-7807
Series E-ISSN: 2198-7815
Edition Number: 1
Number of Pages: X, 222
Number of Illustrations: 47 b/w illustrations, 146 illustrations in colour
Additional Information: Original Chinese edition published by Tsinghua University Press, Beijing, 2013
Topics: Electronic Circuits and Devices, Characterization and Evaluation of Materials, Measurement Science and Instrumentation, Magnetism, Magnetic Materials, Solid Mechanics