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Fast Electrical and Optical Measurements

Volume 1 - Current and Voltage Measurements Volume 2 - Optical Measurements

  • Book
  • © 1986

Overview

Editors:
  1. James E. Thompson

    1. Electrical Engineering Department, University of Texas at Arlington, Arlington, USA

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    You can also search for this editor in PubMed   Google Scholar

  2. Lawrence H. Luessen

    1. Naval Surface Weapons Center, Dahlgren, USA

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: NATO Science Series E: (NSSE, volume 108/109)

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Table of contents (39 chapters)

  1. Front Matter

    Pages I-X
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  2. Overview of Applications and Needs

    1. Front Matter

      Pages N1-N1
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    2. Overview of Applications and Needs

      • M. F. Rose, A. K. Hyder, M. Kristiansen
      Pages 1-4

  3. Voltage and Current Measurements

    1. Front Matter

      Pages N3-N3
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    2. Electro-Optical Measurement Techniques

      • Robert E. Hebner
      Pages 5-25

    3. Electro-Optical and Magneto-Optical Studies of Cold Cathode Electron Beam Gun Discharges

      • M. Hugenschmidt
      Pages 27-39

    4. Fiber Optic Magnetic Field and Current Sensors

      • George Chandler
      Pages 41-56

    5. An Electro-Optical Technique for Measuring High Frequency Free Space Electric Fields

      • J. Chang, C. N. Vittitoe
      Pages 57-71

    6. Electromagnetic Sensors and Measurement Techniques

      • Carl E. Baum
      Pages 73-144

    7. Ultrafast Electrical Voltage and Current Monitors

      • W. Pfeiffer
      Pages 145-174

    8. High Speed Electric Field and Voltage Measurements

      • Marco S. DiCapua
      Pages 175-221

    9. High Speed Magnetic Field and Current Measurements

      • Marco S. Di Capua
      Pages 223-262

    10. Nuclear Reaction Diagnostics for Intense Particle Beam Measurements

      • R. J. Leeper
      Pages 263-315

    11. Particle Analyzer Diagnostics for Intense Particle Beam Measurements

      • R. J. Leeper, J. R. Lee, L. Wissel, D. J. Johnson, W. A. Stygar
      Pages 317-349
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Keywords

About this book

An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy­ sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield­ ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti­ cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas­ urements, includes Sections (5) through (9).

Editors and Affiliations

  • Electrical Engineering Department, University of Texas at Arlington, Arlington, USA

    James E. Thompson

  • Naval Surface Weapons Center, Dahlgren, USA

    Lawrence H. Luessen

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