Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (18 chapters)
-
Front Matter
-
Back Matter
Keywords
About this book
Scanning probe microscopy (the collective term for such instruments as the STM, the atomic force microscope and related instrumentation) allows detailed, real space atomic or lattice scale insight into surface structures, information which is ideally correlated with surface reactivity. The use of SPM methods is not restricted to ultrahigh vacuum: the STM and AFM have been used on samples immersed in solution or in ambient air, thus permitting a study of environmental effects on surfaces. At the solid--liquid interface the reactivity derives precisely from the presence of the solution and, in many cases, the application of an external potential.
Topics covered in the present volume include: the advantages of studying the solid--liquid interface and the obtaining of additional information from probe measurements; interrelationships between probe tip, the interface and the tunnelling process; STM measurements on semiconductor surfaces; the scanning electrochemical microscope, AFM and the solid--liquid interface; surface X-ray scattering; cluster formation on graphite electrodes; Cu deposition on Au surfaces; macroscopic events following Cu deposition; deposition of small metallic clusters on carbon; overpotential deposition of metals; underpotential deposition; STM on nanoscale ceramic superlattices; reconstruction events on Au(ijk) surfaces; Au surface reconstructions; friction force measurements on graphite steps under potential control; and the biocompatibility of materials.
Editors and Affiliations
Bibliographic Information
Book Title: Nanoscale Probes of the Solid/Liquid Interface
Editors: Andrew A. Gewirth, Hans Siegenthaler
Series Title: NATO Science Series E:
DOI: https://doi.org/10.1007/978-94-015-8435-7
Publisher: Springer Dordrecht
-
eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media Dordrecht 1995
Hardcover ISBN: 978-0-7923-3454-5Published: 30 April 1995
Softcover ISBN: 978-90-481-4541-6Published: 07 December 2010
eBook ISBN: 978-94-015-8435-7Published: 17 April 2013
Series ISSN: 0168-132X
Edition Number: 1
Number of Pages: XVI, 334
Topics: Electrochemistry, Physical Chemistry, Surfaces and Interfaces, Thin Films, Measurement Science and Instrumentation