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Semiconductor Device Reliability

  • Book
  • © 1990

Overview

Editors:
  1. A. Christou

    1. Surface Physics Branch, Naval Research Laboratory, USA

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  2. B. A. Unger

    1. Bell Communications Research, Red Bank, USA

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: NATO Science Series E: (NSSE, volume 175)

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Table of contents (33 chapters)

  1. Front Matter

    Pages i-ix
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  3. Reliability Models and Failure Mechanisms

    1. Statistical Models for Device Reliability; An Overview

      • J. Møltoft
      Pages 107-125

    2. Computer-Aided Analysis of Integrated Circuit Reliability

      • P. Mauri
      Pages 127-136

    3. Reliability Assessment of Cmos Asic Designs

      • M. S. Davies, P. D. T. O’Connor
      Pages 137-146

    4. Models Used in Undersea Fibre Optic Systems Reliability Prediction

      • R. H. Murphy
      Pages 147-160

  4. Failure Analysis

    1. Failure Analysis: The Challenge

      • R. G. Taylor, J. A. Hughes
      Pages 161-175

    2. Gate Metallisation Systems for High Reliability GaAs MESFET Transistors

      • D. V. Morgan, J. Wood
      Pages 177-196

    3. Reliability Limitations of Metal Electrodes on GaAs

      • H. L. Hartnagel
      Pages 197-210

    4. Failure Mechanisms of GaAs MESFETs and Low-Noise HEMTs

      • Fabrizio Magistrali, Carlo Tedesco, Enrico Zanoni
      Pages 211-267

    5. Metal Contact Degradation on III–V Compound Semiconductors

      • G. Kiriakidis, W. T. Anderson, Z. Hatzopoulos, C. Michelakis, D. V. Morgan
      Pages 269-289

    6. Nuclear Methods in the Characterization of Semiconductor Reliability

      • J. C. Soares
      Pages 291-300

  5. Opto-Electronic Reliability (I)

    1. A Review of the Reliability of III–V Opto-electronic Components

      • S. P. Sim
      Pages 301-319

    2. Considerations on the Degradation of DFB Lasers

      • T. Ikegami, M. Fukuda, M. Suzuki
      Pages 321-328

    3. InP-Based 4 × 4 Optical Switch Package Qualification and Reliability

      • K. Mizuishi, T. Kato, H. Inoue, H. Ishida
      Pages 329-342

    4. Modelling the Effects of Degradation on the Spectral Stability of Distributed Feedback Lasers

      • A. R. Goodwin, J. E. A. Whiteaway, R. H. Murphy
      Pages 343-352
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Keywords

About this book

This publication is a compilation of papers presented at the Semiconductor Device Reliabi­ lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin­ isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi­ tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis­ cussed. A brief review of these sessions is presented in this book.

Editors and Affiliations

  • Surface Physics Branch, Naval Research Laboratory, USA

    A. Christou

  • Bell Communications Research, Red Bank, USA

    B. A. Unger

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