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Design, Analysis and Test of Logic Circuits Under Uncertainty

  • Book
  • © 2013

Overview

Authors:
  1. Smita Krishnaswamy

    1. , Dept. of Biological Sciences, Columbia University, New York, USA

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  2. Igor L. Markov

    1. , Dept. of EECS, University of Michigan, Ann Arbor, USA

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  3. John P. Hayes

    1. , Dept. of EECS, University of Michigan, Ann Arbor, USA

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  • Presents a comprehensive overview of Logic Circuits
  • Combines theory with practical examples
  • Multi-discipline approach to the "hot" topic of uncertainty
  • Includes supplementary material: sn.pub/extras

Part of the book series: Lecture Notes in Electrical Engineering (LNEE, volume 115)

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Table of contents (7 chapters)

  1. Front Matter

    Pages i-xi
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  2. Introduction

    • Smita Krishnaswamy, Igor L. Markov, John P. Hayes
    Pages 1-19

  3. Probabilistic Transfer Matrices

    • Smita Krishnaswamy, Igor L. Markov, John P. Hayes
    Pages 21-36

  4. Computing with Probabilistic Transfer Matrices

    • Smita Krishnaswamy, Igor L. Markov, John P. Hayes
    Pages 37-52

  5. Testing Logic Circuits for Probabilistic Faults

    • Smita Krishnaswamy, Igor L. Markov, John P. Hayes
    Pages 53-61

  6. Signature-Based Reliability Analysis

    • Smita Krishnaswamy, Igor L. Markov, John P. Hayes
    Pages 63-91

  7. Design for Robustness

    • Smita Krishnaswamy, Igor L. Markov, John P. Hayes
    Pages 93-113

  8. Summary and Extensions

    • Smita Krishnaswamy, Igor L. Markov, John P. Hayes
    Pages 115-120

  9. Back Matter

    Pages 121-123
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Keywords

About this book

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Authors and Affiliations

  • , Dept. of Biological Sciences, Columbia University, New York, USA

    Smita Krishnaswamy

  • , Dept. of EECS, University of Michigan, Ann Arbor, USA

    Igor L. Markov, John P. Hayes

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