Authors:
- Flash NAND design
- NAND – SSD co-development
- Radiation effects on Flash memories
- Charge trap technology overview
- Includes supplementary material: sn.pub/extras
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Table of contents (19 chapters)
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Front Matter
About this book
Authors and Affiliations
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Integrated Devices Technology, Agrate Brianza, Italy
Rino Micheloni
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Forward Insights, North York, Canada
Luca Crippa
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Integrated Device Technology, Agrate Brianza, Italy
Alessia Marelli
Bibliographic Information
Book Title: Inside NAND Flash Memories
Authors: Rino Micheloni, Luca Crippa, Alessia Marelli
DOI: https://doi.org/10.1007/978-90-481-9431-5
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media B.V. 2010
Hardcover ISBN: 978-90-481-9430-8Published: 18 August 2010
Softcover ISBN: 978-94-007-9834-2Published: 19 October 2014
eBook ISBN: 978-90-481-9431-5Published: 27 July 2010
Edition Number: 1
Number of Pages: X, 582
Topics: Circuits and Systems, Mass Spectrometry, Condensed Matter Physics, Solid State Physics, Spectroscopy and Microscopy