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  • © 2009

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

  • Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applications
  • Applies theory from a wide variety of scientific fields (machine learning, computational finance, number theory, actuarial studies)
  • Covers relevant theory in detail
  • This is the first book to present these novel techniques
  • Extensive experiments, illustrative examples and analysis
  • Includes supplementary material: sn.pub/extras

Part of the book series: Lecture Notes in Electrical Engineering (LNEE, volume 46)

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Table of contents (4 chapters)

  1. Front Matter

    Pages i-xv
  2. SiLVR: Projection Pursuit for Response Surface Modeling

    • Amith Singhee, Rob A. Rutenbar
    Pages 1-57
  3. Quasi-Monte Carlo for Fast Statistical Simulation of Circuits

    • Amith Singhee, Rob A. Rutenbar
    Pages 59-122
  4. Statistical Blockade: Estimating Rare Event Statistics

    • Amith Singhee, Rob A. Rutenbar
    Pages 123-169
  5. Concluding Observations

    • Amith Singhee, Rob A. Rutenbar
    Pages 171-173
  6. Back Matter

    Pages 175-195

About this book

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.

Reviews

The Statistical Blockade method proposed by Singhee and Rutenbar will make a significant impact on the design of next-generation digital integrated circuits. It has the potential to dramatically reduce simulation time compared to a traditional Monte Carlo approach. Their award winning work is well received by industry and has influenced research directions in academia.
- Prof. Anantha Chandrakasan, MIT

Bibliographic Information

  • Book Title: Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

  • Authors: Amith Singhee, Rob A. Rutenbar

  • Series Title: Lecture Notes in Electrical Engineering

  • DOI: https://doi.org/10.1007/978-90-481-3100-6

  • Publisher: Springer Dordrecht

  • eBook Packages: Engineering, Engineering (R0)

  • Copyright Information: Springer Science+Business Media B.V. 2009

  • Hardcover ISBN: 978-90-481-3099-3Published: 10 August 2009

  • Softcover ISBN: 978-94-007-3687-0Published: 07 March 2012

  • eBook ISBN: 978-90-481-3100-6Published: 14 August 2009

  • Series ISSN: 1876-1100

  • Series E-ISSN: 1876-1119

  • Edition Number: 1

  • Number of Pages: XV, 195

  • Topics: Circuits and Systems, Data Structures, System Performance and Evaluation

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access