Modern Developments and Applications in Microbeam Analysis

1. Front Matter

   Pages I-XI

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2. Recent Developments in Instrumentation for X-Ray Microanalysis

   • Peter J. Statham

   Pages 1-9

3. High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors

   • L. Strüder, C. Fiorini, E. Gatti, R. Hartmann, P. Holl, N. Krause et al.

   Pages 11-19

4. Efficiency Calibration of a Si(Li) Detector by EPMA

   • Kurt Röhrbacher, Michael Andrae, Martin Völkerer, Johann Wernisch

   Pages 21-28

5. Wavelength-Dispersive X-Ray Spectrometry

   • Stephen J. B. Reed

   Pages 29-36

6. X-Ray Spectrum Processing and Multivariate Analysis

   • John M. Titchmarsh

   Pages 37-47

7. Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope

   • David B. Williams, Masashi Watanabe, Derrick T. Carpenter

   Pages 49-57

8. On the Spatial Resolution in Analytical Electron Microscopy

   • Aldo Armigliato, David J. Howard, Roberto Balboni, Stefano Frabboni, Matty R. Caymax

   Pages 59-64

9. Contamination in Analytical Electron Microscopy and in ALCHEMI

   • János L. Lábár, Miklós Adamik, István Dódony

   Pages 65-71

10. Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at.% Zn Alloy

    • Paweł Zięba

    Pages 73-76

11. Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials

    • Goran Dražič, Barbara Malič, Marija Kosec

    Pages 77-82

12. Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations

    • Marek Faryna, Lidia Lityńska, Krzysztof Haberko, Zbigniew Pędzich, Joanna Babiarz

    Pages 83-86

13. Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br, I) Nano- and Microcrystals

    • Vladimir P. Oleshko, Renaat H. Gijbels, Willem A. Jacob, Andre J. Van Daele

    Pages 87-92

14. Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs

    • Igor Levin, Alexander Berner, Christina Scheu, Harald Muellejans, David G. Brandon

    Pages 93-96

15. SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation

    • Yongchang Fan, Alexander G. Fitzgerald, Hanchang Xu

    Pages 97-100

16. Surface Characterisation and Modification of YBCO Thin Films by STM

    • Alexander G. Fitzgerald, Yongchang Fan, Hanchang Xu

    Pages 101-107

17. Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA

    • Peter Karduck

    Pages 109-123

18. EPMA Sputter Depth Profiling, Part I: Theory and Evaluation

    • Silvia Richter, Norbert Lesch, Peter Karduck

    Pages 125-131

19. EPMA Sputter Depth Profiling, Part II: Experiment

    • Norbert Lesch, Silvia Richter, Peter Karduck

    Pages 133-139

20. Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS

    • Peter Willich, Ulrike Wischmann

    Pages 141-147

This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen­ tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non­ dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.

• X-ray
• calibration
• ceramics
• electron microscopy
• glass
• materials science
• metals
• microscopy
• spectroscopy

• Centre for Electron Optical Studies, University of Bath, UK

  Glyn Love

• Department of Physics and Astronomy, University of Glasgow, UK

  W. A. Patrick Nicholson

• Istituto LAMEL, C.N.R., Bologna, Italy

  Aldo Armigliato

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