Analysis and Simulation of Heterostructure Devices

1. Front Matter

   Pages I-XX

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2. Introduction

   • Vassil Palankovski, Rüdiger Quay

   Pages 1-3

3. State-of-the-Art of Materials, Device Modeling, and RF Devices

   • Vassil Palankovski, Rüdiger Quay

   Pages 4-25

4. Physical Models

   • Vassil Palankovski, Rüdiger Quay

   Pages 26-140

5. RF Parameter Extraction for HEMTs and HBTs

   • Vassil Palankovski, Rüdiger Quay

   Pages 141-153

6. Heterojunction Bipolar Transistors

   • Vassil Palankovski, Rüdiger Quay

   Pages 154-203

7. High Electron Mobility Transistors

   • Vassil Palankovski, Rüdiger Quay

   Pages 204-235

8. Novel Devices

   • Vassil Palankovski, Rüdiger Quay

   Pages 236-238

9. Back Matter

   Pages 239-289

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Communication and information systems are subject to rapid and highly so­ phisticated changes. Currently semiconductor heterostructure devices, such as Heterojunction Bipolar Transistors (HBTs) and High Electron Mobility Transis­ tors (HEMTs), are among the fastest and most advanced high-frequency devices. They satisfy the requirements for low power consumption, medium integration, low cost in large quantities, and high-speed operation capabilities in circuits. In the very high-frequency range, cut-off frequencies up to 500 GHz [557] have been reported on the device level. HEMTs and HBTs are very suitable for high­ efficiency power amplifiers at 900 MHz as well as for data rates higher than 100 Gbitfs for long-range communication and thus cover a broad range of appli­ cations. To cope with explosive development costs and the competition of today's semicon­ ductor industry, Technology Computer-Aided Design (TCAD) methodologies are used extensively in development and production. As of 2003, III-V semiconductor HEMT and HBT micrometer and millimeter-wave integrated circuits (MICs and MMICs) are available on six-inch GaAs wafers. SiGe HBT circuits, as part of the CMOS technology on eight-inch wafers, are in volume production. Simulation tools for technology, devices, and circuits reduce expensive technological efforts. This book focuses on the application of simulation software to heterostructure devices with respect to industrial applications. In particular, a detailed discussion of physical modeling for a great variety of materials is presented.

• HBTs
• HEMTs
• Heterojunction Bipolar Transistors
• High Electron Mobility Transistors
• PES
• STEM
• Simulation
• compound semiconductors
• device optimization
• device reliability
• semiconductor development

• Institüt für Mikroelektronik, Technische Universität Wien, Austria

  Vassil Palankovski

• Fraunhofer Institut für Angewandte Festkörperphysik (IAF), Freiburg, Germany

  Rüdiger Quay

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