Name: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
ISBN: 978-3-662-24778-5

Editors:

G. Möllenstedt⁰,
K. H. Gaukler¹

G. Möllenstedt
1. Institut für angewandte Physik der Universität, Tübingen, Germany
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K. H. Gaukler
1. Institut für angewandte Physik der Universität, Tübingen, Germany
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Table of contents (101 chapters)

Front Matter

Pages I-XII

PDF
X-Ray Optics
1. Present State of X-Ray Interferometry
  
  U. Bonse
  
  Pages 1-10
2. X-Ray Reflection Optics (Recent Developments)
  
  J. F. McGee, D. R. Hesser, J. W. Milton
  
  Pages 11-26
3. The Figuring of an Aspherical X-Ray Lens
  
  J. F. McGee, I. M. Arrazola
  
  Pages 27-32
4. Untersuchung zur ASR (Anomalous Surface Reflection) von Röntgenstrahlen mit einer Mikrofokus-Röntgenröhre
  
  K. Beck, G. Kühnen
  
  Pages 33-38
5. Grazing Incidence X-Ray Telescopes
  
  W. P. Reidy, R. Giacconi, G. Vaiana, L. van Speybroeck, T. Zehnpfennig
  
  Pages 39-44
6. Application of X-Ray Optical Methods in Solar Astronomy
  
  U. Mayer
  
  Pages 45-49
7. Detection of Weak X-Ray Sources by Image Integration
  
  H. J. Einighammer
  
  Pages 50-54
8. Resolution Error Correction of Small Angle Scattering Data Using Hermite Functions
  
  F. Hossfeld
  
  Pages 55-57
Electron Probe Microanalysis. Physical Bases
1. Principles and Limitations of Electron Probe Microanalysis
  
  V. E. Cosslett
  
  Pages 58-63
2. Recent Progress of Electron Microprobe in Japan
  
  G. Shinoda
  
  Pages 64-75
3. Measurements of Backscattered Electron Energy Spectra for Primary Beam Energies of 10 to 30 keV
  
  E. F. H. St. G. Darlington
  
  Pages 76-79
4. Peak to Background Ratio in Microprobe Analysis
  
  S. J. B. Reed
  
  Pages 80-83
5. A Study of the Deadtime Correction in Electron Probe Microanalysis
  
  D. R. Beaman, R. Lewis, J. A. Isasi
  
  Pages 84-92
6. The Measurement of Total Mass per Unit Area and Elemental Weight-Fractions along Line Scans in Thin Specimens
  
  T. A. Hall, P. Werba
  
  Pages 93-98
7. A Method for Composition Determination of Alloy Thin Films
  
  B. Djurić, D. Cerović
  
  Pages 99-103
8. An Experimental Method for Determining the Depth Distribution of Characteristic X-Rays in Electron Microprobe Specimens
  
  U. Schmitz, P. L. Ryder, W. Pitsch
  
  Pages 104-113
Electron Probe Microanalysis. Quantitative Analysis
1. Etat actuel des méthodes quantitatives d’analyse par sonde électronique
  
  J. Philibert
  
  Pages 114-131
2. Présentation d’un programme de calcul sur ordinateur des diverses corrections à appliquer aux analyses à la microsonde électronique
  
  C. Zeller, F. Zeller
  
  Pages 132-134
3. Programme de calcul de l’intensité des rayons X émis en microanalyse à sonde électronique et analyse quantitative
  
  B. Pascal
  
  Pages 135-140

Keywords

Editors and Affiliations

Institut für angewandte Physik der Universität, Tübingen, Germany

G. Möllenstedt, K. H. Gaukler

Bibliographic Information

Book Title: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Editors: G. Möllenstedt, K. H. Gaukler
DOI: https://doi.org/10.1007/978-3-662-24778-5
Publisher: Springer Berlin, Heidelberg
eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1969
Softcover ISBN: 978-3-662-22845-6Published: 01 January 1969
eBook ISBN: 978-3-662-24778-5Published: 02 July 2013
Edition Number: 1
Number of Pages: XII, 612
Number of Illustrations: 687 b/w illustrations, 3 illustrations in colour
Topics: Quantum Optics

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Table of contents (101 chapters)

Front Matter

X-Ray Optics

Electron Probe Microanalysis. Physical Bases

Electron Probe Microanalysis. Quantitative Analysis

Keywords

Editors and Affiliations

Institut für angewandte Physik der Universität, Tübingen, Germany

Bibliographic Information

Publish with us

Buy it now

Buying options

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