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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

  • Book
  • © 1969

Overview

Editors:
  1. G. Möllenstedt

    1. Institut für angewandte Physik der Universität, Tübingen, Germany

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  2. K. H. Gaukler

    1. Institut für angewandte Physik der Universität, Tübingen, Germany

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Table of contents (101 chapters)

  1. Front Matter

    Pages I-XII
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  2. X-Ray Optics

    1. Present State of X-Ray Interferometry

      • U. Bonse
      Pages 1-10

    2. X-Ray Reflection Optics (Recent Developments)

      • J. F. McGee, D. R. Hesser, J. W. Milton
      Pages 11-26

    3. The Figuring of an Aspherical X-Ray Lens

      • J. F. McGee, I. M. Arrazola
      Pages 27-32

    4. Untersuchung zur ASR (Anomalous Surface Reflection) von Röntgenstrahlen mit einer Mikrofokus-Röntgenröhre

      • K. Beck, G. Kühnen
      Pages 33-38

    5. Grazing Incidence X-Ray Telescopes

      • W. P. Reidy, R. Giacconi, G. Vaiana, L. van Speybroeck, T. Zehnpfennig
      Pages 39-44

    6. Application of X-Ray Optical Methods in Solar Astronomy

      • U. Mayer
      Pages 45-49

    7. Detection of Weak X-Ray Sources by Image Integration

      • H. J. Einighammer
      Pages 50-54

    8. Resolution Error Correction of Small Angle Scattering Data Using Hermite Functions

      • F. Hossfeld
      Pages 55-57

  3. Electron Probe Microanalysis. Physical Bases

    1. Principles and Limitations of Electron Probe Microanalysis

      • V. E. Cosslett
      Pages 58-63

    2. Recent Progress of Electron Microprobe in Japan

      • G. Shinoda
      Pages 64-75

    3. Measurements of Backscattered Electron Energy Spectra for Primary Beam Energies of 10 to 30 keV

      • E. F. H. St. G. Darlington
      Pages 76-79

    4. Peak to Background Ratio in Microprobe Analysis

      • S. J. B. Reed
      Pages 80-83

    5. A Study of the Deadtime Correction in Electron Probe Microanalysis

      • D. R. Beaman, R. Lewis, J. A. Isasi
      Pages 84-92

    6. The Measurement of Total Mass per Unit Area and Elemental Weight-Fractions along Line Scans in Thin Specimens

      • T. A. Hall, P. Werba
      Pages 93-98

    7. A Method for Composition Determination of Alloy Thin Films

      • B. Djurić, D. Cerović
      Pages 99-103

    8. An Experimental Method for Determining the Depth Distribution of Characteristic X-Rays in Electron Microprobe Specimens

      • U. Schmitz, P. L. Ryder, W. Pitsch
      Pages 104-113
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Keywords

Editors and Affiliations

  • Institut für angewandte Physik der Universität, Tübingen, Germany

    G. Möllenstedt, K. H. Gaukler

Bibliographic Information

  • Book Title: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

  • Editors: G. Möllenstedt, K. H. Gaukler

  • DOI: https://doi.org/10.1007/978-3-662-24778-5

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1969

  • Softcover ISBN: 978-3-662-22845-6Published: 01 January 1969

  • eBook ISBN: 978-3-662-24778-5Published: 02 July 2013

  • Edition Number: 1

  • Number of Pages: XII, 612

  • Number of Illustrations: 687 b/w illustrations, 3 illustrations in colour

  • Topics: Quantum Optics

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