Skip to main content
SpringerLink
Log in
Book cover

Transmission Electron Microscopy

Physics of Image Formation and Microanalysis

  • Book
  • © 1997

Overview

Authors:
  1. Ludwig Reimer

    1. Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Münster, Germany

    View author publications

    You can also search for this author in PubMed   Google Scholar

Part of the book series: Springer Series in Optical Sciences (SSOS, volume 36)

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 74.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (11 chapters)

  1. Front Matter

    Pages I-XVI
    Download chapter PDF

  2. Introduction

    • Ludwig Reimer
    Pages 1-15

  3. Particle Optics of Electrons

    • Ludwig Reimer
    Pages 17-43

  4. Wave Optics of Electrons

    • Ludwig Reimer
    Pages 45-77

  5. Elements of a Transmission Electron Microscope

    • Ludwig Reimer
    Pages 79-142

  6. Electron-Specimen Interactions

    • Ludwig Reimer
    Pages 143-196

  7. Scattering and Phase Contrast for Amorphous Specimens

    • Ludwig Reimer
    Pages 197-273

  8. Theory of Electron Diffraction

    • Ludwig Reimer
    Pages 275-329

  9. Electron Diffraction Modes and Applications

    • Ludwig Reimer
    Pages 331-361

  10. Imaging of Crystalline Specimens and Their Defects

    • Ludwig Reimer
    Pages 363-422

  11. Elemental Analysis by X-Ray and Electron Energy-Loss Spectroscopy

    • Ludwig Reimer
    Pages 423-461

  12. Specimen Damage by Electron Irradiation

    • Ludwig Reimer
    Pages 463-494

  13. Back Matter

    Pages 495-587
    Download chapter PDF
Back to top

Keywords

About this book

Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.

Authors and Affiliations

  • Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Münster, Germany

    Ludwig Reimer

Bibliographic Information

  • Book Title: Transmission Electron Microscopy

  • Book Subtitle: Physics of Image Formation and Microanalysis

  • Authors: Ludwig Reimer

  • Series Title: Springer Series in Optical Sciences

  • DOI: https://doi.org/10.1007/978-3-662-14824-2

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1997

  • eBook ISBN: 978-3-662-14824-2Published: 11 November 2013

  • Series ISSN: 0342-4111

  • Series E-ISSN: 1556-1534

  • Edition Number: 4

  • Number of Pages: XVI, 587

  • Number of Illustrations: 185 b/w illustrations

  • Topics: Measurement Science and Instrumentation, Cell Biology

Publish with us

Policies and ethics

Back to top

Search

Navigation