Skip to main content
  • Book
  • © 1979

X-Ray Spectroscopy

An Introduction

Authors:

Part of the book series: Springer Series in Optical Sciences (SSOS, volume 15)

Buy it now

Buying options

eBook USD 74.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Other ways to access

This is a preview of subscription content, log in via an institution to check for access.

Table of contents (8 chapters)

  1. Front Matter

    Pages I-XIII
  2. Continuous X-Rays

    • Bipin K. Agarwal
    Pages 1-51
  3. Characteristic X-Rays

    • Bipin K. Agarwal
    Pages 53-119
  4. Interaction of X-Rays with Matter

    • Bipin K. Agarwal
    Pages 121-179
  5. Secondary Spectra and Satellites

    • Bipin K. Agarwal
    Pages 181-222
  6. Scattering of X-Rays

    • Bipin K. Agarwal
    Pages 223-239
  7. Chemical Shifts and Fine Structure

    • Bipin K. Agarwal
    Pages 241-309
  8. Soft X-Ray Spectroscopy

    • Bipin K. Agarwal
    Pages 311-330
  9. Experimental Methods

    • Bipin K. Agarwal
    Pages 331-358
  10. Back Matter

    Pages 359-420

About this book

Rontgen's discovery of X-rays in 1895 launched a subject which became central to the development of modern physics. The verification of many of the predic­ tions of quantum theory by X-ray spectroscopy in the early part of the twen­ tieth century stimulated great interest in thi's area, which has subsequently influenced fields as diverse as chemical physics, nuclear physics, and the study of the electronic properties of solids, and led to the development of techniques such as Auger, Raman, and X-ray photoelectron spectroscopy. The improvement of the theoretical understanding of the physics underlying X-ray spectroscopy has been accompanied by advances in experimental techniques, and the subject provides an instructive example of how progress on both these fronts can be mutually beneficial. This book strikes a balance between his­ torical description, which illustrates this symbiosis, and the discussion of new developments. The application of X-ray spectroscopic methods to the in­ vestigation of chemical bonding receives special attention, and an up-to-date account is given of the use of extended X-ray absorption fine structure (EXAFS) in determining interatomic distances, which has attracted much attention dur­ ing the last decade. This monograph is intended to be used as a basic text for a one-year course at postgraduate level, and aims to provide the general background that is es­ sential to enable the reader to participate fruitfully in the growing research activity in this field.

Authors and Affiliations

  • Department of Physics, X-Ray Laboratory, University of Allahabad, Allahabad, India

    Bipin K. Agarwal

Bibliographic Information

  • Book Title: X-Ray Spectroscopy

  • Book Subtitle: An Introduction

  • Authors: Bipin K. Agarwal

  • Series Title: Springer Series in Optical Sciences

  • DOI: https://doi.org/10.1007/978-3-662-14469-5

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1979

  • eBook ISBN: 978-3-662-14469-5Published: 11 November 2013

  • Series ISSN: 0342-4111

  • Series E-ISSN: 1556-1534

  • Edition Number: 1

  • Number of Pages: XIII, 420

  • Number of Illustrations: 9 b/w illustrations

  • Topics: Atomic, Molecular, Optical and Plasma Physics

Buy it now

Buying options

eBook USD 74.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Other ways to access