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Table of contents (9 chapters)
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Front Matter
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Back Matter
About this book
Keywords
- Rasterelektronen Mikroskopie
- Scanning Tunneling Microscopy
- ASTER
- crystal
- diffraction
- electron
- electron microscope
- electron microscopy
- electron optics
- microscopy
- optics
- scanning electron microscope
- scanning electron microscopy
- scanning tunneling microscopy
- scattering
- transmission electron microscopy
- X-ray
Authors and Affiliations
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Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Münster, Fed. Rep. of Germany
Ludwig Reimer
Bibliographic Information
Book Title: Scanning Electron Microscopy
Book Subtitle: Physics of Image Formation and Microanalysis
Authors: Ludwig Reimer
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-3-662-13562-4
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1985
eBook ISBN: 978-3-662-13562-4Published: 11 November 2013
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 1
Number of Pages: XVIII, 463
Number of Illustrations: 243 b/w illustrations