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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

Tübingen, September 9th–14th, 1968

  • Conference proceedings
  • © 1969

Overview

Editors:
  1. G. Möllenstedt

    1. Institut für angewandte Physik, Universität, 74 Tübingen, Germany

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  2. K. H. Gaukler

    1. Institut für angewandte Physik, Universität, 74 Tübingen, Germany

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Table of contents (101 papers)

  1. Front Matter

    Pages I-XII
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  2. X-Ray Optics

    1. Present State of X-Ray Interferometry

      • U. Bonse
      Pages 1-10

    2. X-Ray Reflection Optics (Recent Developments)

      • J. F. Mcgee, D. R. Hesser, J. W. Milton
      Pages 11-26

    3. The Figuring of an Aspherical X-Ray Lens

      • J. F. Mcgee, I. M. Arrazola
      Pages 27-32

    4. Untersuchung zur ASR (Anomalous Surface Reflection) von Röntgenstrahlen mit einer Mikrofokus-Röntgenröhre

      • K. Beck, G. Kühnen
      Pages 33-38

    5. Grazing Incidence X-Ray Telescopes

      • W. P. Reidy, R. Giacconi, G. Vaiana, L. van Speybroeck, T. Zehnpfennig
      Pages 39-44

    6. Application of X-Ray Optical Methods in Solar Astronomy

      • U. Mayer
      Pages 45-49

    7. Detection of Weak X-Ray Sources by Image Integration

      • H. J. Einighammer
      Pages 50-54

    8. Resolution Error Correction of Small Angle Scattering Data Using Hermite Functions

      • F. Hossfeld
      Pages 55-57

  3. Electron Probe Microanalysis. Physical Bases

    1. Principles and Limitations of Electron Probe Microanalysis

      • V. E. Cosslett
      Pages 58-63

    2. Recent Progress of Electron Microprobe in Japan

      • G. Shinoda
      Pages 64-75

    3. Measurements of Backscattered Electron Energy Spectra for Primary Beam Energies of 10 to 30 keV

      • E. F. H. St. G. Darlington
      Pages 76-79

    4. Peak to Background Ratio in Microprobe Analysis

      • S. J. B. Reed
      Pages 80-83

    5. A Study of the Deadtime Correction in Electron Probe Microanalysis

      • D. R. Beaman, R. Lewis, J. A. Isasi
      Pages 84-92

    6. The Measurement of Total Mass per Unit Area and Elemental Weight-Fractions along Line Scans in Thin Specimens

      • T. A. Hall, P. Werba
      Pages 93-98

    7. A Method for Composition Determination of Alloy Thin Films

      • B. Djurić, D. Cerović
      Pages 99-103

    8. An Experimental Method for Determining the Depth Distribution of Characteristic X-Rays in Electron Microprobe Specimens

      • U. Schmitz, P. L. Ryder, W. Pitsch
      Pages 104-113
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About this book

The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal­ lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.

Editors and Affiliations

  • Institut für angewandte Physik, Universität, 74 Tübingen, Germany

    G. Möllenstedt, K. H. Gaukler

Bibliographic Information

  • Book Title: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

  • Book Subtitle: Tübingen, September 9th–14th, 1968

  • Editors: G. Möllenstedt, K. H. Gaukler

  • DOI: https://doi.org/10.1007/978-3-662-12108-5

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1969

  • Softcover ISBN: 978-3-662-12110-8Published: 20 November 2013

  • eBook ISBN: 978-3-662-12108-5Published: 29 June 2013

  • Edition Number: 1

  • Number of Pages: XII, 612

  • Number of Illustrations: 547 b/w illustrations, 1 illustrations in colour

  • Topics: Physics, general

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