Overview
- First book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Advanced Microelectronics (MICROELECTR., volume 10)
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Table of contents (7 chapters)
Keywords
About this book
Authors and Affiliations
About the authors
Otwin Breitenstein studied physics at Leipzig university and graduated there in 1980. After dealing with spatially resolved capacitance spectroscopy of point defects (Scanning-DLTS) at the Institute of Solid State Physics and Electron Microscopy in Halle until 1992, he is a scientific staff member at Max Planck Institute of Microstructure Physics, Halle. His main interest field is electronic device and materials analysis by electron microscopic and IR-based methods.
Wilhelm Warta studied Physics at Würzburg and then Stuttgart University, where he graduated and received his PhD with research on charge transport properties of organic molecular crystals. 1985 he joined Fraunhofer Institute for Solar Energy Systems in Freiburg starting with work on carrier lifetime measurement techniques for semiconductor materials. His fields are the development of measurement techniques for solar cell development, characterization of solar cell material and solar cells, device and process simulation as well as high precision calibration of solar cells.
Bibliographic Information
Book Title: Lock-in Thermography
Book Subtitle: Basics and Use for Evaluating Electronic Devices and Materials
Authors: Otwin Breitenstein, Martin Langenkamp
Series Title: Springer Series in Advanced Microelectronics
DOI: https://doi.org/10.1007/978-3-662-08396-3
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2003
eBook ISBN: 978-3-662-08396-3Published: 09 March 2013
Series ISSN: 1437-0387
Series E-ISSN: 2197-6643
Edition Number: 1
Number of Pages: VIII, 195
Additional Information: Originally published under: Breitenstein, O.; Langenkamp, M. and with the title "Lock-in Thermography - Basics and Applications to Functional Diagnostics of Electronic Components"
Topics: Electronics and Microelectronics, Instrumentation, Measurement Science and Instrumentation, Optical and Electronic Materials, Nanotechnology, Engineering, general