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Porous Silicon Science and Technology

Winter School Les Houches, 8 to 12 February 1994

  • Book
  • © 1995

Overview

Editors:
  1. Jean-Claude Vial

    1. CNRS-Université Joseph Fourier, France

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    You can also search for this editor in PubMed   Google Scholar

  2. Jacques Derrien

    1. CNRS-Université Aix-Marseille 2, France

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: Centre de Physique des Houches (LHWINTER, volume 1)

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Table of contents (21 chapters)

  1. Front Matter

    Pages I-XVII
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  2. Fundamental aspects of the semiconductor-solution interface

    • L. M. Peter
    Pages 1-15

  3. The silicon/electrolyte interface

    • J.-N. Chazalviel
    Pages 17-32

  4. Porous silicon: material processing, properties and applications

    • A. Halimaoui
    Pages 33-52

  5. Luminescence of porous silicon after electrochemical oxidation

    • R. Herino
    Pages 53-66

  6. Mechanism for light emission from nanoscale silicon

    • M. S. Hybertsen
    Pages 67-90

  7. Theory of silicon crystallites. Part II

    • C. Delerue, G. Allan, E. Martin, M. Lannoo
    Pages 91-110

  8. Doping of a quantum dot and self-limiting effect in electrochemical etching

    • R. Tsu, D. Babić
    Pages 111-119

  9. Electronic and optical properties of semiconductors quantum wells

    • R. Ferreira
    Pages 121-136

  10. What can be learned from time resolved measurements on porous silicon luminescence

    • J. C. Vial
    Pages 137-155

  11. Ion beam analysis of thin films. Applications to porous silicon

    • C. Ortega, A. Grosman, V. Morazzani
    Pages 157-187

  12. IR spectroscopy of porous silicon

    • W. Theiss
    Pages 189-205

  13. Nano characterization of porous silicon by transmission electron microscopy

    • I. Berbezier
    Pages 207-223

  14. Electron paramagnetic resonance spectroscopy: Defect and structural analysis of solids

    • H. J. von Bardeleben, M. Schoisswohl
    Pages 225-246

  15. Raman scattering in silicon nanostructures

    • B. Champagnon, I. Gregora, Y. Monin, E. Duval, L. Saviot
    Pages 247-253

  16. Scattering of X-rays

    • A. Naudon, P. Goudeau, V. Vezin
    Pages 255-275

  17. X-ray photoemission spectroscopy

    • H. Münder
    Pages 277-292

  18. Optoelectronic properties of porous silicon — The electroluminescent devices

    • W. Lang, P. Steiner, F. Kozlowski
    Pages 293-305

  19. Porous silicon luminescence under cathodic polarisation conditions

    • A. Bsiesy
    Pages 307-322

  20. Interrelation between electrical properties and visible luminescence of porous silicon

    • N. Koshida
    Pages 323-328
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Keywords

About this book

The discovery of bright visible light emission from porous silicon has opened the door to various nanometer sized silicon structures where the confinement of carriers gives rise to interesting physical properties. While the high efficiency of the light emission in the visible range is the common and the most prominent feature, their structures display similar properties with other highly divided materials (even non semiconductors), and then justify a multidisciplinary approach. This along with potential applications has attracted a large number of researchers followed by students to be trained. Until now international conferences have provided the exchange of information but have remained highly specialised so it was time to give thought to the organisation of topical and advanced lectures where the multidisciplinarity and the didactic approach are paramount. L'ecole des Houches was ideally devoted to that purpose. The meeting : " Luminescence of porous silicon and silicon nanostructures" was the first international school on this topic but some aspects in the organisation and the attendance have given an international workshop flavor to it. The school by itself has trained 82 «students», most of them were students starting their Ph. D thesis. 50% were French citizens and the other represented countries were Germany, England, USA, Czechoslovakia, The Netherlands, Italy, Japan, Poland, Spain, Canada, Brazil, India and Russia.

Editors and Affiliations

  • CNRS-Université Joseph Fourier, France

    Jean-Claude Vial

  • CNRS-Université Aix-Marseille 2, France

    Jacques Derrien

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