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Table of contents (8 chapters)
Keywords
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Bibliographic Information
Book Title: Mikroprozessorsysteme
Book Subtitle: Zuverlässigkeit, Testverfahren, Fehlertoleranz
Authors: Rolf Hedtke
DOI: https://doi.org/10.1007/978-3-642-93257-1
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin, Heidelberg 1984
Softcover ISBN: 978-3-540-12996-7Published: 01 December 1983
eBook ISBN: 978-3-642-93257-1Published: 08 March 2013
Edition Number: 1
Number of Pages: VI, 206
Topics: Mathematical and Computational Engineering, Electronics and Microelectronics, Instrumentation