Scanning Microscopy

1. Front Matter

   Pages I-X

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2. Performance and selection criteria of critical components of STM and AFM

   • Yves Martin

   Pages 1-10

3. Investigations on the SFM

   • Rainer Kassing

   Pages 11-31

4. New Scanning Microscopy Techniques: Scanning Noise Microscopy Scanning Tunneling Microscopy Assisted by Surface Plasmons

   • R. Möller

   Pages 32-48

5. AN STM Study of the Oxygenation of Silicon

   • M. E. Welland, R. B. Leane

   Pages 49-75

6. Scanning Near Field Optical Microscopy

   • U. Ch. Fischer

   Pages 76-84

7. Study of epitaxial growth by combination of STM and LEED

   • M. Henzler, U. Köhler, O. Jusko

   Pages 85-101

8. STM Studies of Adsorbates in the Monolayer Range: Ag/Ni(100) and O/Ni(100)

   • A. Brodde, G. Wilhelmi, H. Neddermeyer

   Pages 102-116

9. Molecular Imaging with the Scanning Tunneling Microscope

   • Jürgen P. Rabe

   Pages 117-134

10. Imaging of Magnetic Domains in Ferromagnets and Superconductors by Force and Tunneling Microscopy

    • U. Hartmann, R. Berthe, T. Göddenhenrich, H. Lemke, C. Heiden

    Pages 135-152

11. Acoustic Microscopy: Pictures to Ponder

    • G. A. D. Briggs, R. Gundle, C. W. Lawrence, A. Rodriguez-Rey, C. B. Scruby

    Pages 153-166

12. Real-Time Confocal Scanning Microscope — An Optical Instrument with a Better Depth Resolution

    • T. Sure

    Pages 167-185

13. On the Search for Last Frontiers Scanning Tunneling Microscopy and Related Techniques (Abstract)

    • D. W. Pohl

    Pages 186-186

14. STM and AFM extensions (Abstract)

    • H. K. Wickramasinghe

    Pages 187-187

15. Back Matter

    Pages 189-209

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With the invention of the scanning tunneling microscope in 1982 by Binnig and Rohrer and the subsequent award of the Nobel Prize, the field of scan­ ning microscopy was given a strong boost in view of its wide range of ap­ plications. In particular, expanding the capability to access nature's foundations at the atomic level is now recognized as having the potential for major impact in Infonnation Technology. This third volume of the ESPRIT Basic Research Series provides a well structured overview of the state of the art of scanning microscopy and re­ cent advances including results of ESPRIT Basic Research Actions 3109 and 3314. April 1992 G. Metakides Preface The IMO Symposium Fall '90, Wetzlar, FRO, October 1/2, 1990, brought together leading scientists and researchers in scanning microscopy from re­ search institutes and industries, each of whom was invited to contribute a lecture which was followed by a discussion. The resulting contributions are contained in this proceedings. Microscopic techniques are used not only for research work in material and life science but also for routine applications in almost any vital section of our everyday life. The demand for coming to a better understanding of materials and their behaviour under different conditions and environments as well as all aspects of human life initiated an ongoing development for improved microscopic techniques.

• Atomare Auflösung
• Atomic Resolution
• Microspitzen
• Microtips
• Nahfeldmikroskopie
• Nearfield Microscopy
• Rastermikroskopie
• Scanning Microscopy
• development

• Institut für Technische Physik, Universität Kassel, Kassel, Germany

  Rainer Kassing

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