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Structural Analysis of Point Defects in Solids

An Introduction to Multiple Magnetic Resonance Spectroscopy

  • Book
  • © 1992

Overview

Authors:
  1. Johann-Martin Spaeth

    1. Fachbereich Physik, Universität-Gesamthochschule, Paderborn, Fed. Rep. of Germany

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  2. Jürgen R. Niklas

    1. Fachbereich Physik, Universität-Gesamthochschule, Paderborn, Fed. Rep. of Germany

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  3. Ralph H. Bartram

    1. Department of Physics, University of Connecticut, Storrs, USA

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Part of the book series: Springer Series in Solid-State Sciences (SSSOL, volume 43)

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Table of contents (9 chapters)

  1. Front Matter

    Pages I-XI
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  2. Introduction

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 1-10

  3. Fundamentals of Electron Paramagnetic Resonance

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 11-33

  4. Electron Paramagnetic Resonance Spectra

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 35-76

  5. Optical Detection of Electron Paramagnetic Resonance

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 77-138

  6. Electron Nuclear Double Resonance

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 139-168

  7. Determination of Defect Symmetries from ENDOR Angular Dependences

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 169-229

  8. Theoretical Interpretation of Superhyperfine and Quadrupole Interactions

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 231-279

  9. Technology of ENDOR Spectrometers

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 281-307

  10. Experimental Aspects of Optically Detected EPR and ENDOR

    • Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram
    Pages 309-328

  11. Back Matter

    Pages 329-369
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Keywords

About this book

Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essentialfor applications to the determination of microscopic defect structures. Investigations of the microscopic and electronic structure, and also correlations with the magnetic propertiesof solids, require various multiple magnetic resonance methods, such as ENDOR and optically detected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniques comprehensively, from a practical viewpoint, with many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures isprovided with the necessary tools, together with much information on computer-aided methods of data analysis and the principles of modern spectrometer design.

Authors and Affiliations

  • Fachbereich Physik, Universität-Gesamthochschule, Paderborn, Fed. Rep. of Germany

    Johann-Martin Spaeth, Jürgen R. Niklas

  • Department of Physics, University of Connecticut, Storrs, USA

    Ralph H. Bartram

Bibliographic Information

  • Book Title: Structural Analysis of Point Defects in Solids

  • Book Subtitle: An Introduction to Multiple Magnetic Resonance Spectroscopy

  • Authors: Johann-Martin Spaeth, Jürgen R. Niklas, Ralph H. Bartram

  • Series Title: Springer Series in Solid-State Sciences

  • DOI: https://doi.org/10.1007/978-3-642-84405-8

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1992

  • Softcover ISBN: 978-3-642-84407-2Published: 11 January 2012

  • eBook ISBN: 978-3-642-84405-8Published: 06 December 2012

  • Series ISSN: 0171-1873

  • Series E-ISSN: 2197-4179

  • Edition Number: 1

  • Number of Pages: XI, 367

  • Topics: Condensed Matter Physics, Theoretical and Computational Chemistry, Physical Chemistry

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