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Multiple Diffraction of X-Rays in Crystals

  • Book
  • © 1984

Overview

Authors:
  1. Shih-Lin Chang

    1. Instituto de Física, Universidade Estadual de Campinas, Campinas, Brazil

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Part of the book series: Springer Series in Solid-State Sciences (SSSOL, volume 50)

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Table of contents (7 chapters)

  1. Front Matter

    Pages I-XI
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  2. Introduction

    • Shih-Lin Chang
    Pages 1-6

  3. Geometry, Peak Indexing, and Experimental Techniques

    • Shih-Lin Chang
    Pages 7-34

  4. Kinematical Theory of Diffraction

    • Shih-Lin Chang
    Pages 35-71

  5. Dynamical Theory of X-Ray Diffraction

    • Shih-Lin Chang
    Pages 72-133

  6. Approximations, Numerical Computing, and Other Approaches

    • Shih-Lin Chang
    Pages 134-180

  7. Case Studies

    • Shih-Lin Chang
    Pages 181-224

  8. Applications

    • Shih-Lin Chang
    Pages 225-283

  9. Back Matter

    Pages 285-300
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Keywords

About this book

The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg's law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction. This type of diffraction should, in prin­ ciple, reflect three-dimensional information about the structure of the dif­ fracting material. Recent progress in understanding this diffraction phenome­ non and in utilizing this diffraction technique in solid-state and materials sciences reveals the diversity as well as the importance of multiple diffraction of x-rays in application. Unfortunately, there has been no single book written that gives a sys­ tematic review of this type of diffraction, encompasses its diverse applica­ tions, and foresees future trends gf development. It is for this purpose that this book is designed. It is hoped that its appearance may possibly turn more attention of condensed-matter physicists, chemists and material scientists toward this particular phenomenon, and that new methods of non-destructive analysis of matter using this diffraction technique may be developed in the future.

Authors and Affiliations

  • Instituto de Física, Universidade Estadual de Campinas, Campinas, Brazil

    Shih-Lin Chang

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