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Point Defects in Semiconductors II

Experimental Aspects

  • Book
  • © 1983

Overview

Part of the book series: Springer Series in Solid-State Sciences (SSSOL, volume 35)

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Table of contents (9 chapters)

Keywords

About this book

In introductory solid-state physics texts we are introduced to the concept of a perfect crystalline solid with every atom in its proper place. This is a convenient first step in developing the concept of electronic band struc­ ture, and from it deducing the general electronic and optical properties of crystalline solids. However, for the student who does not proceed further, such an idealization can be grossly misleading. A perfect crystal does not exist. There are always defects. It was recognized very early in the study of solids that these defects often have a profound effect on the real physical properties of a solid. As a result, a major part of scientific research in solid-state physics has,' from the early studies of "color centers" in alkali halides to the present vigorous investigations of deep levels in semiconductors, been devoted to the study of defects. We now know that in actual fact, most of the interest­ ing and important properties of solids-electrical, optical, mechanical- are determined not so much by the properties of the perfect crystal as by its im­ perfections.

Authors and Affiliations

  • Groupe de Physique des Solides de l’Ecole Normale Supérieure, Université de Paris VII, Paris Cedex, France

    Jacques Bourgoin

  • Laboratoire d’Etude des Surfaces et Interfaces, Physique des Solides, Institut Superieur d’Electronique du Nord, Lille Cédex, France

    Michel Lannoo

Bibliographic Information

  • Book Title: Point Defects in Semiconductors II

  • Book Subtitle: Experimental Aspects

  • Authors: Jacques Bourgoin, Michel Lannoo

  • Series Title: Springer Series in Solid-State Sciences

  • DOI: https://doi.org/10.1007/978-3-642-81832-5

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1983

  • Softcover ISBN: 978-3-642-81834-9Published: 08 December 2011

  • eBook ISBN: 978-3-642-81832-5Published: 06 December 2012

  • Series ISSN: 0171-1873

  • Series E-ISSN: 2197-4179

  • Edition Number: 1

  • Number of Pages: XVI, 295

  • Topics: Crystallography and Scattering Methods

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