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Point Defects in Semiconductors I

Theoretical Aspects

  • Book
  • © 1981

Overview

Part of the book series: Springer Series in Solid-State Sciences (SSSOL, volume 22)

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Table of contents (7 chapters)

Keywords

About this book

From its early beginning before the war, the field of semiconductors has developped as a classical example where the standard approximations of 'band theory' can be safely used to study its interesting electronic properties. Thus in these covalent crystals, the electronic structure is only weakly coupled with the atomic vibrations; one-electron Bloch functions can be used and their energy bands can be accurately computed in the neighborhood of the energy gap between the valence and conduction bands; nand p doping can be obtained by introducing substitutional impurities which only introduce shallow donors and acceptors and can be studied by an effective-mass weak-scattering description. Yet, even at the beginning, it was known from luminescence studies that these simple concepts failed to describe the various 'deep levels' introduced near the middle of the energy gap by strong localized imperfections. These imperfections not only include some interstitial and many substitutional atoms, but also 'broken bonds' associated with surfaces and interfaces, dis­ location cores and 'vacancies', i.e., vacant iattice sites in the crystal. In all these cases, the electronic structure can be strongly correlated with the details of the atomic structure and the atomic motion. Because these 'deep levels' are strongly localised, electron-electron correlations can also playa significant role, and any weak perturbation treatment from the perfect crystal structure obviously fails. Thus, approximate 'strong coupling' techniques must often be used, in line' with a more chemical de­ scription of bonding.

Authors and Affiliations

  • Laboratoire d’Etude des Surfaces et Interfaces, Physique des Solides, Institut Superieur d’Electronique du Nord, Lille Cédex, France

    Michel Lannoo, Jacques Bourgoin

Bibliographic Information

  • Book Title: Point Defects in Semiconductors I

  • Book Subtitle: Theoretical Aspects

  • Authors: Michel Lannoo, Jacques Bourgoin

  • Series Title: Springer Series in Solid-State Sciences

  • DOI: https://doi.org/10.1007/978-3-642-81574-4

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1981

  • Softcover ISBN: 978-3-642-81576-8Published: 10 January 2012

  • eBook ISBN: 978-3-642-81574-4Published: 06 December 2012

  • Series ISSN: 0171-1873

  • Series E-ISSN: 2197-4179

  • Edition Number: 1

  • Number of Pages: XVII, 265

  • Topics: Crystallography and Scattering Methods

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