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Table of contents (28 papers)
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Introduction
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Experimental Study of the Formation of Semiconductor Interfaces
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Structural Characterization of the Interfaces
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Electronic Properties of Interfaces
Keywords
About this book
Editors and Affiliations
Bibliographic Information
Book Title: Semiconductor Interfaces: Formation and Properties
Book Subtitle: Proceedings of the Workkshop, Les Houches, France February 24–March 6, 1987
Editors: Guy Lay, Jacques Derrien, Nino Boccara
Series Title: Springer Proceedings in Physics
DOI: https://doi.org/10.1007/978-3-642-72967-6
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1987
Softcover ISBN: 978-3-642-72969-0Published: 06 December 2011
eBook ISBN: 978-3-642-72967-6Published: 06 December 2012
Series ISSN: 0930-8989
Series E-ISSN: 1867-4941
Edition Number: 1
Number of Pages: XI, 389
Topics: Crystallography and Scattering Methods, Surfaces and Interfaces, Thin Films, Optical and Electronic Materials, Physical Chemistry, Electronics and Microelectronics, Instrumentation, Optics, Lasers, Photonics, Optical Devices