Semiconductor Interfaces: Formation and Properties

1. Front Matter

   Pages I-XI

   PDF

2. Introduction

   1. Front Matter

      Pages 1-1

      PDF

   2. An Introduction to the Formation and Properties of Semiconductor Interfaces

      • C. A. Sébenne

      Pages 2-7

3. Experimental Study of the Formation of Semiconductor Interfaces

   1. Front Matter

      Pages 9-9

      PDF

   2. Formation of Semiconductor Interfaces During Molecular Beam Epitaxy

      • K. Ploog

      Pages 10-42

   3. Build-up and Characterization of “Artificial” Surfaces for III—V Compound Semiconductors

      • J. M. Moison

      Pages 43-46

4. Structural Characterization of the Interfaces

   1. Front Matter

      Pages 47-47

      PDF

   2. Atomic Structure of Semiconductor Surfaces

      • G. Le Lay

      Pages 48-65

   3. Monolayer Sensitive X-Ray Diffraction Techniques: A Short Guided Tour Through the Literature

      • M. Sauvage-Simkin

      Pages 66-68

   4. SEXAFS for Semiconductor Interface Studies

      • G. Rossi

      Pages 69-87

   5. XANES and XARS for Semiconductor Interface Studies

      • G. Rossi

      Pages 88-101

   6. Recent Progress in Electron Spectroscopy: Application to the Local Geometry Determination at Surfaces and Interfaces

      • J. Derrien

      Pages 102-108

   7. On the Use of Electron Microscopy in the Study of Semiconductor Interfaces

      • J.-P Chevalier

      Pages 109-113

   8. Analytical Scanning Electron Microscopy Under Ultra High Vacuum

      • P. Morin

      Pages 114-118

   9. Scanning Tunneling Microscopy and Spectroscopy

      • F. Salvan

      Pages 119-125

   10. Field Emission Microscopy for Analysis of Semiconductor Surfaces

       • V. T. Binh

       Pages 126-133

   11. Surface and Interface Studies with MeV Ion Beams

       • C. Cohen

       Pages 134-149

   12. Surface Characterization by Low-Energy Ion Scattering

       • E. Taglauer

       Pages 150-159

5. Electronic Properties of Interfaces

   1. Front Matter

      Pages 161-161

      PDF

   2. Band Structure Theory of Semiconductor Surfaces and Interfaces

      • C. Calandra, F. Manghi

      Pages 162-181

The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom­ mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel­ oped, powerful techniques such as scanning tunneling microscopy, high reso­ lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.

• development
• diffraction
• electronic properties
• microscopy
• optical properties
• optoelectronic devices
• production
• semiconductor
• spectroscopy
• transistor

• Campus de Luminy, C.R.M.C.2, CNRS, Marseille, Cedex 09, France

  Guy Lay

• L.E.P.E.S., CNRS, Grenoble, France

  Jacques Derrien

• Centre de Physique Théorique, Les Houches, France

  Nino Boccara

Policies and ethics