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Analytical Methods High-Melting Metals

  • Conference proceedings
  • © 1982

Overview

Editors:
  1. H. C. Freyhardt

    1. Kristall-Labor der Physikalischen Institute, Göttingen, Germany
      Institut für Metallphysik, Universität Göttingen, Göttingen, Germany

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Part of the book series: Crystals (CRYSTALS, volume 7)

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Table of contents (4 papers)

  1. Front Matter

    Pages i-v
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  2. High-Resolution Electron Microscopy of Crystals

    • W. Neumann, M. Pasemann, J. Heydenreich
    Pages 1-46

  3. In-situ UHV Electron Microscopy of Surfaces

    • Katsumichi Yagi, Kunio Takayanagi, Goro Honjo
    Pages 47-74

  4. EXAFS Studies of Crystalline Materials

    • Gordon S. Knapp, Panayotis Georgopoulos
    Pages 75-105

  5. Single Crystals of Refractory and Rare Metals, Alloys, and Compounds

    • Evgenij M. Savitsky, Gennady S. Burkhanov, Valentina M. Kirillova
    Pages 107-148

  6. Back Matter

    Pages 149-152
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Keywords

About this book

In solid state physics and in materials science the investigation of the connection between the properties of solids and their microstructure is of major importance. For crystalline materials this connection is related to the lattice structure, and it can be shown convinc­ ingly that the material properties depend on deviations from the ideal lattice structure in the majority of cases. For this reason a reliable detection and analysis of defects in "nearly perfect" crystals is necessary, and a sufficient spatial resolution of the methods applied is required. Because electrons on the one hand strongly interact with the matter to be investigated and on the other hand can easily be focused electron-optical methods are very advantageous for this purpose. They are used in the diffraction mode, in the imaging mode and in the spectroscopic mode. The attainable high lateral resolution in the imaging mode makes the application of electron microscopy especially effective. Although already valuable information on crystal defects can be gained by using the routine technique of diffraction contrast imagingl-3) which has a resolution of some 4 10 nm - in the special weak-beam technique ) of some nm -, the detection of crystal defects and inhomogeneities, resp. on an atomic or molecular level by the aid of high­ resolution electron microscopy gets increasing importance.

Editors and Affiliations

  • Kristall-Labor der Physikalischen Institute, Göttingen, Germany

    H. C. Freyhardt

  • Institut für Metallphysik, Universität Göttingen, Göttingen, Germany

    H. C. Freyhardt

Bibliographic Information

  • Book Title: Analytical Methods High-Melting Metals

  • Editors: H. C. Freyhardt

  • Series Title: Crystals

  • DOI: https://doi.org/10.1007/978-3-642-68731-0

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1982

  • Softcover ISBN: 978-3-642-68733-4Published: 06 December 2011

  • eBook ISBN: 978-3-642-68731-0Published: 06 December 2012

  • Series ISSN: 0172-5076

  • Edition Number: 1

  • Number of Pages: VI, 152

  • Topics: Inorganic Chemistry, Physical Chemistry

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