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Surface Crystallography by LEED

Theory, Computation and Structural Results

  • Book
  • © 1979

Overview

Authors:
  1. Michel A. Hove

    1. Materials and Molecular Research Division, Lawrence Berkeley Laboratory, University of California, Berkeley, USA
      Department of Chemistry, University of California, Berkeley, USA

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  2. Shuk Yin Tong

    1. Surface Studies Laboratory, Department of Physics, University of Wisconsin-Milwaukee, Milwaukee, USA

    View author publications

    You can also search for this author in PubMed   Google Scholar

Part of the book series: Springer Series in Chemical Physics (CHEMICAL, volume 2)

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Table of contents (12 chapters)

  1. Front Matter

    Pages I-IX
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  2. Introduction

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 1-6

  3. The Physics of LEED

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 7-19

  4. Basic Aspects of the Programs

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 20-33

  5. Symmetry and Its Use

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 34-42

  6. Calculation of Diffraction Matrices for Single Bravais-Lattice Layers

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 43-48

  7. The Combined Space Method for Composite Layers: by Matrix Inversion

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 49-57

  8. The Combined Space Method for Composite Layers: by Reverse Scattering Perturbation

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 58-64

  9. Stacking Layers by Layer Doubling

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 65-70

  10. Stacking Layers by Renormalized Forward Scattering (RFS) Perturbation

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 71-74

  11. Assembling a Program: the Main Program and the Input

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 75-156

  12. Subroutine Listings

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 157-250

  13. Structural Results of LEED Crystallography

    • Michel A. Van Hove, Shuk Yin Tong
    Pages 251-266

  14. Back Matter

    Pages 267-288
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Keywords

About this book

Surface science has experienced an impressive growth in the last two decades. The attention has focussed mainly on single-crystal surfaces with, on the atomic scale, relatively simple and well-defined structures (for example, clean surfaces and such surfaces with limited amounts of additional foreign atoms and molecules). One of the most fundamental types of information needed about solid surfaces concerns the relative atomic positions. The geometrical arrangement of surface atoms influences most physical and chemical properties of surfaces, the list of which is long and includes a number of important technological applications: electronic surface states, contact potentials, work functions, oxidation, heterogeneous catalysis, friction, adhesion, crys­ tal growth etc. Surface crystallography - the determination of relative atomic positions at surfaces - has found a successful tool in Low-Energy Electron Diffraction (LEED): this technique has now determined the atomic positions for nearly a hundred surfaces, whether in the clean state or with additional foreign atoms or molecules. The main aim of this book is to publish a set of computer pro­ grams that has been specifically designed for and extensively used in surface crystallography by LEED. These programs are based on the dynamical (i.e.

Authors and Affiliations

  • Materials and Molecular Research Division, Lawrence Berkeley Laboratory, University of California, Berkeley, USA

    Michel A. Hove

  • Department of Chemistry, University of California, Berkeley, USA

    Michel A. Hove

  • Surface Studies Laboratory, Department of Physics, University of Wisconsin-Milwaukee, Milwaukee, USA

    Shuk Yin Tong

Bibliographic Information

  • Book Title: Surface Crystallography by LEED

  • Book Subtitle: Theory, Computation and Structural Results

  • Authors: Michel A. Hove, Shuk Yin Tong

  • Series Title: Springer Series in Chemical Physics

  • DOI: https://doi.org/10.1007/978-3-642-67195-1

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1979

  • Softcover ISBN: 978-3-642-67197-5Published: 18 October 2011

  • eBook ISBN: 978-3-642-67195-1Published: 06 December 2012

  • Series ISSN: 0172-6218

  • Series E-ISSN: 2364-9003

  • Edition Number: 1

  • Number of Pages: X, 288

  • Topics: Crystallography and Scattering Methods, Materials Science, general

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