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  • © 2003

Low Dielectric Constant Materials for IC Applications

  • First one in the emerging field of low dielectric constant materials
  • There is worldwide a big need for such a book
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Series in Advanced Microelectronics (MICROELECTR., volume 9)

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Table of contents (10 chapters)

  1. Front Matter

    Pages I-XIX
  2. Materials Issues and Characterization of Low-k Dielectric Materials

    • E. T. Ryan, A. J. McKerrow, J. Leu, P. S. Ho
    Pages 23-74
  3. Vapor Deposition of Low-k Polymeric Dielectrics

    • W. N. Gill, S. Rogojevic, T. Lu
    Pages 95-119
  4. Plasma-Enhanced Chemical Vapor Deposition of FSG and a-C:F Low-k Materials

    • K. Endo, K. Kishimoto, Y. Matsubara, K. Koyanagi
    Pages 121-166
  5. Porous Organosilicates for On-Chip Applications: Dielectric Generational Extendibility by the Introduction of Porosity

    • W. Volksen, C. J. Hawker, J. L. Hedrick, V. Lee, T. Magbitang, M. Toney et al.
    Pages 167-202
  6. Metal/Polymer Interfacial Interactions

    • D. M. Martini, J. A. Kelber
    Pages 203-220
  7. Diffusion Of Metals In Polymers And During Metal/Polymer Interface Formation

    • F. Faupel, A. Thran, M. Kiene, T. Strunskus, V. Zaporojtchenko, K. Behnke
    Pages 221-251
  8. Plasma Etching of Low Dielectric Constant Materials

    • G. S. Oehrlein, T. E. F. M. Standaert, P. J. Matsuo
    Pages 253-276
  9. Integration of SiLK Semiconductor Dielectric

    • Joost J. Waeterloos
    Pages 277-304
  10. Back Matter

    Pages 305-309

About this book

Low dielectric constant materials are an important component of microelectronic devices. This comprehensive book covers the latest low-dielectric-constant (low-k) materials technology, thin film materials characterization, integration and reliability for back-end interconnects and packaging applications in microelectronics. Highly informative contributions from leading academic and industrial laboratories provide comprehensive information about materials technologies for < 0.18 um process technology. Topics include: Organic dielectric materials, Inorganic dielectric materials, Composite dielectric materials, Metrology and characterization techniques, Integration, Reliability. This volume will be an invaluable resource for professionals, scientists, researchers and graduate students involved in dielectric technology development, materials science, polymer science, and semiconductor devices and processing.

Reviews

From the reviews:

Praise for P.S. Ho, J. Leu, and W.W. Lee, Ed's, Low Dielectric Constant Materials for IC Applications

Electrical Insulation Magazine

"Because this volume contains an excellent overview of the current research and issues with low-k dielectric materials for IC applications along with comprehensive practical information, researches, material scientists, and polymer engineers working in the area of microelectronics will find this book a very valuable addition to their library."

"This text addresses the latest advances in low-k materials, thin film characterization, integration into copper interconnection processing, and reliability for microelectronics applications. … Because this volume contains an excellent overview of the current research and issues with low-k dielectric materials for IC applications along with comprehensive practical information, researchers, material scientists, and polymer engineers working in the area of microelectronics will find this book a very valuable addition to their library." (IEEE Electrical Insulation Magazine, Vol. 20 (2), March/April, 2004)

"This book addresses issues on the development, characterization and integration of low dielectric constant (k) materials for advanced on-chip interconnects. … this book illustrates in a comprehensive way the technological challenges brought by the introduction of low-k materials into semiconductor manufacturing. … Being intended to researchers and engineers active in the field of semiconductor processing, it can be used as an introductory book … . Highly appreciated." (Jean - Francois de Marneffe, Physicalia, Vol. 25 (4), 2003)

Editors and Affiliations

  • Texas Materials Institute, The University of Texas at Austin, Austin, USA

    Paul S. Ho

  • Intel Corp., MS: RA1-204, Hillsboro, USA

    Jihperng Jim Leu

  • Taiwan Semiconductor Manufacturing Co. (TSMC), Hsin-chu, Taiwan

    Wei William Lee

Bibliographic Information

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access