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Point Defects in Semiconductors and Insulators

Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions

  • Book
  • © 2003

Overview

Authors:
  1. Johann-Martin Spaeth

    1. Fachbereich Physik, Universität Paderborn, Paderborn, Germany

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  2. Harald Overhof

    1. Fachbereich Physik, Universität Paderborn, Paderborn, Germany

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    You can also search for this author in PubMed   Google Scholar

Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 51)

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Table of contents (9 chapters)

  1. Front Matter

    Pages I-XI
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  2. Introduction

    • Johann-Martin Spaeth, Harald Overhof
    Pages 1-10

  3. Fundamentals of Electron Paramagnetic Resonance

    • Johann-Martin Spaeth, Harald Overhof
    Pages 11-33

  4. Electron Paramagnetic Resonance Spectra

    • Johann-Martin Spaeth, Harald Overhof
    Pages 35-73

  5. Optical Detection of Electron Paramagnetic Resonance

    • Johann-Martin Spaeth, Harald Overhof
    Pages 75-162

  6. Electron Nuclear Double Resonance

    • Johann-Martin Spaeth, Harald Overhof
    Pages 163-195

  7. Analysis of ENDOR Spectra

    • Johann-Martin Spaeth, Harald Overhof
    Pages 197-264

  8. Electrical Detection of Electron Paramagnetic Resonance

    • Johann-Martin Spaeth, Harald Overhof
    Pages 265-308

  9. Theoretical ab initio Calculations of Hyperfine Interactions

    • Johann-Martin Spaeth, Harald Overhof
    Pages 309-413

  10. Experimental Aspects of Optically Detected EPR and ENDOR

    • Johann-Martin Spaeth, Harald Overhof
    Pages 415-442

  11. Back Matter

    Pages 443-492
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Keywords

About this book

The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap­ peared about 10 years ago. Since then a very active development has oc­ curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor­ rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for "fundamental" studies in solid state physics. Therefore a more "pedestrian" access to the meth­ ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc­ tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the structural information one can get from "forbidden" transitions as well as on spatial correlations between defects in the so-called "cross relaxation spectroscopy". High-field ODEPR/ENDOR was also added. The chapter on stationary electron nuclear double resonance (ENDOR) was supplemented by the method of stochastic END OR developed a few years ago in Paderborn which is now also commercially available.

Authors and Affiliations

  • Fachbereich Physik, Universität Paderborn, Paderborn, Germany

    Johann-Martin Spaeth, Harald Overhof

Bibliographic Information

  • Book Title: Point Defects in Semiconductors and Insulators

  • Book Subtitle: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions

  • Authors: Johann-Martin Spaeth, Harald Overhof

  • Series Title: Springer Series in Materials Science

  • DOI: https://doi.org/10.1007/978-3-642-55615-9

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 2003

  • Hardcover ISBN: 978-3-540-42695-0Published: 22 January 2003

  • Softcover ISBN: 978-3-642-62722-4Published: 14 September 2012

  • eBook ISBN: 978-3-642-55615-9Published: 17 April 2013

  • Series ISSN: 0933-033X

  • Series E-ISSN: 2196-2812

  • Edition Number: 1

  • Number of Pages: XI, 492

  • Topics: Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials

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