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EXAFS and Near Edge Structure

Proceedings of the International Conference Frascati, Italy, September 13–17, 1982

  • Conference proceedings
  • © 1983

Overview

Editors:
  1. Antonio Bianconi

    1. Dipartimento di Fisica, Università di Roma, Roma, Italy

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  2. Lucia Incoccia

    1. Laboratori Nazionali di Frascati, PULS-CNR, Frascati, Italy

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  3. Stanislao Stipcich

    1. Laboratori Nazionali di Frascati, INFN, Frascati, Italy

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Part of the book series: Springer Series in Chemical Physics (CHEMICAL, volume 27)

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Table of contents (95 papers)

  1. Front Matter

    Pages I-XII
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  2. Introduction. Historical Perspective of EXAFS and Near Edge Structure Spectroscopy

    1. Introduction. Historical Perspective of EXAFS and Near Edge Structure Spectroscopy

      • A. Bianconi
      Pages 1-2

  3. Theoretical Aspects of EXAFS and XANES

    1. Front Matter

      Pages 3-3
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    2. The Transition Region Between XANES and EXAFS

      • J. B. Pendry
      Pages 4-10

    3. Bond Angle Determination by EXAFS: A New Dimension

      • Boon-Keng Teo
      Pages 11-21

    4. Role of Inelastic Effects in EXAFS

      • J. J. Rehr, S.-H. Chou
      Pages 22-28

    5. Relaxation Effects in Inner-Shell Photoemission and Absorption

      • Göran Wendin
      Pages 29-36

    6. Multiple Scattering Calculations of XANES

      • P. J. Durham
      Pages 37-42

    7. Near Edge Absorption Structure in the Framework of the Multiple Scattering Model. Potential Resonance or Barrier Effects?

      • C. R. Natoli
      Pages 43-56

    8. Bond Length Determination Using XANES

      • A. Bianconi, M. Dell’Ariccia, A. Gargano, C. R. Natoli
      Pages 57-61

    9. Double Ionization in Inner Shells

      • E. Bernieri, E. Burattini, N. Cavallo, M. R. Masullo, A. Morone, R. Rinizivillo et al.
      Pages 62-64

  4. EXAFS Data Analysis

    1. Front Matter

      Pages 65-65
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    2. The Reliability of ab initio Calculations in Extracting Structural Information from EXAFS

      • R. F. Pettifer, A. D. Cox
      Pages 66-72

    3. EXAFS Analysis in Anisotropic Systems

      • Peter Rabe
      Pages 73-79

    4. EXAFS in Metallurgy

      • E. Dartyge, A. Fontaine, J. Mimault
      Pages 80-86

    5. The Effect of the Noise on the Structural Parameters Deduced by EXAFS

      • Settimio Mobilio, Lucia Incoccia
      Pages 87-90

    6. Debye-Waller Factors in R-Space Analysis

      • Lucia Incoccia, Settimio Mobilio
      Pages 91-95

    7. Thickness Effects on the Determination of EXAFS Amplitudes

      • J. Goulon, C. Goulon-Ginet, R. Cortes, J. M. Dubois
      Pages 96-97

    8. Thickness Effects in X-Ray Absorption Measurements

      • S. M. Heald
      Pages 98-99

    9. Interference and Multiple Scattering Effects in Porphyrinic Complexes

      • J. Goulon, P. Friant, J. L. Poncet, R. Guilard, J. Fischer, L. Ricard
      Pages 100-102
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Keywords

About this book

The field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi­ cult to keep up with the literature. EXAFS and XANES are becoming interdis­ ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab­ sorption Fine Structure) and its applications. The other topic of the con­ ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ­ ent parts on various types of materials: amorphous metals, glasses, solu­ tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob­ lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn­ chrotron radiation and laboratory EXAFS.

Editors and Affiliations

  • Dipartimento di Fisica, Università di Roma, Roma, Italy

    Antonio Bianconi

  • Laboratori Nazionali di Frascati, PULS-CNR, Frascati, Italy

    Lucia Incoccia

  • Laboratori Nazionali di Frascati, INFN, Frascati, Italy

    Stanislao Stipcich

Bibliographic Information

  • Book Title: EXAFS and Near Edge Structure

  • Book Subtitle: Proceedings of the International Conference Frascati, Italy, September 13–17, 1982

  • Editors: Antonio Bianconi, Lucia Incoccia, Stanislao Stipcich

  • Series Title: Springer Series in Chemical Physics

  • DOI: https://doi.org/10.1007/978-3-642-50098-5

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1983

  • Softcover ISBN: 978-3-642-50100-5Published: 01 July 2012

  • eBook ISBN: 978-3-642-50098-5Published: 06 December 2012

  • Series ISSN: 0172-6218

  • Series E-ISSN: 2364-9003

  • Edition Number: 1

  • Number of Pages: XII, 422

  • Number of Illustrations: 193 b/w illustrations

  • Topics: Crystallography and Scattering Methods

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