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In-situ Materials Characterization

Across Spatial and Temporal Scales

  • Book
  • © 2014

Overview

Editors:
  1. Alexander Ziegler

    1. Microscopy & Microanalysis Unit, The University of the Witwatersrand, Johannesburg, Germany

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  2. Heinz Graafsma

    1. Photon-Science Detector Group, Deutsches Elektronen Synchrotron, Hamburg, Germany

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  3. Xiao Feng Zhang

    1. Nanotechnology Systems Division, Hitachi High Technologies America, Inc., Pleasanton, USA

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  4. Joost W.M. Frenken

    1. Leiden University Kamerlingh Onnes Laboratory, Leiden, The Netherlands

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  • Scientific status report on analytical techniques in nano-and surface sciences
  • Presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy
  • Presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering
  • Includes supplementary material: sn.pub/extras

Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 193)

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Table of contents (7 chapters)

  1. Front Matter

    Pages i-xi
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  2. In-situ Characterization of Molecular Processes in Liquids by Ultrafast X-ray Absorption Spectroscopy

    • Majed Chergui
    Pages 1-38

  3. In-situ X-ray Diffraction at Synchrotrons and Free-Electron Laser Sources

    • Vedran Vonk, Heinz Graafsma
    Pages 39-58

  4. In-situ Transmission Electron Microscopy

    • Xiao Feng Zhang
    Pages 59-109

  5. Ultrafast Transmission Electron Microscopy and Electron Diffraction

    • Alexander Ziegler
    Pages 111-145

  6. In-situ and Kinetic Studies Using Neutrons

    • Götz Eckold, Helmut Schober
    Pages 147-179

  7. Scanning Tunneling Microscopy at Elevated Pressure

    • Joost W. M. Frenken
    Pages 181-206

  8. Detectors for Electron and X-ray Scattering and Imaging Experiments

    • Alexander Ziegler, Heinz Graafsma
    Pages 207-250

  9. Back Matter

    Pages 251-256
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Keywords

About this book

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

Editors and Affiliations

  • Microscopy & Microanalysis Unit, The University of the Witwatersrand, Johannesburg, Germany

    Alexander Ziegler

  • Photon-Science Detector Group, Deutsches Elektronen Synchrotron, Hamburg, Germany

    Heinz Graafsma

  • Nanotechnology Systems Division, Hitachi High Technologies America, Inc., Pleasanton, USA

    Xiao Feng Zhang

  • Leiden University Kamerlingh Onnes Laboratory, Leiden, The Netherlands

    Joost W.M. Frenken

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