Authors:
- First book summarizing the state-of-the-art of this technique
- Real industrial applications included
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (16 chapters)
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Front Matter
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Characterization
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Front Matter
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Industrial Applications
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Front Matter
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About this book
This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
Reviews
From the reviews:
"The editors have done an excellent job of maintaining a coherent theme throughout, while keeping the repetition of ideas to a minimum. It is therefore effective when read as a whole but will also find good use as a reference book."..…"This is an excellent book for all users of SPM interested in real technological applications".
Steven R. Schofield, School of Mathematical and Physical Sciences, University of Newcastle
Journal: "The Physicist", Vol. 41, No. 6, p. 200
"This book describes some of the many ways in which SPMs are being used in the development and characterisation of real nano technological processes and devices. The editors have done an excellent job of maintaining a coherent theme throughout … . It is therefore effective when read as a whole but will also find good use as a reference book. … This is an excellent book for all users of SPM interested in real technological applications." (Steven R Schofield, The Physicist, Vol. 41 (6), November/December, 2004)
"The focus of this book is recent, practical applications of scanning probe microscopy (SPM). Because it is written by leading experts in SPM techniques, the book is strongly recommended to those working in the emerging area of nanotechnology. … Each chapter contains the relevant references and the book ends with a comprehensive index." (Mircea Dragoman, Optics and Photonics News, April, 2006)
Authors and Affiliations
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Department of Mechanical Engineering, The Ohio State University, Columbus, USA
Bharat Bhushan
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Universität Münster, Münster, Germany
Harald Fuchs
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Dept. Electronic Engineering, Gunma University, Kiryu-City, Japan
Sumio Hosaka
Bibliographic Information
Book Title: Applied Scanning Probe Methods I
Authors: Bharat Bhushan, Harald Fuchs, Sumio Hosaka
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-642-35792-3
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2004
Hardcover ISBN: 978-3-540-00527-8Published: 13 January 2004
Softcover ISBN: 978-3-642-05602-4Published: 06 December 2010
eBook ISBN: 978-3-642-35792-3Published: 26 February 2014
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XX, 476
Topics: Nanotechnology, Polymer Sciences, Physical Chemistry, Solid State Physics, Spectroscopy and Microscopy, Analytical Chemistry