Overview
- First book dedicated soley to Kelvin force microscopy
- Explains basics, realization, modulation and data interpretation
- Provides important application examples
- Useful reference to researchers and graduate students alike
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 48)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (13 chapters)
-
Front Matter
-
Selected Applications
-
Front Matter
-
-
Back Matter
Keywords
About this book
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Editors and Affiliations
Bibliographic Information
Book Title: Kelvin Probe Force Microscopy
Book Subtitle: Measuring and Compensating Electrostatic Forces
Editors: Sascha Sadewasser, Thilo Glatzel
Series Title: Springer Series in Surface Sciences
DOI: https://doi.org/10.1007/978-3-642-22566-6
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2012
Hardcover ISBN: 978-3-642-22565-9Published: 22 October 2011
Softcover ISBN: 978-3-642-27113-7Published: 30 November 2013
eBook ISBN: 978-3-642-22566-6Published: 22 October 2011
Series ISSN: 0931-5195
Series E-ISSN: 2198-4743
Edition Number: 1
Number of Pages: XIV, 334
Topics: Surfaces and Interfaces, Thin Films, Thermodynamics, Engineering Thermodynamics, Heat and Mass Transfer