Overview
- SiC is an important new material for power electronics, a substrate for GaN devices and even a blue-light-emitting semiconductor
- The top level of SiC research is presented in this book
- Includes supplementary material: sn.pub/extras
Part of the book series: Advanced Texts in Physics (ADTP)
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (36 chapters)
-
Front Matter
-
Crystal Growth
-
Front Matter
-
-
Surface and Interface Properties
-
Front Matter
-
Keywords
About this book
Since the 1997 publication of "Silicon Carbide - A Review of Fundamental Questions and Applications to Current Device Technology" edited by Choyke, et al., there has been impressive progress in both the fundamental and developmental aspects of the SiC field. So there is a growing need to update the scientific community on the important events in research and development since then. The editors have again gathered an outstanding team of the world's leading SiC researchers and design engineers to write on the most recent developments in SiC. The book is divided into five main categories: theory, crystal growth, characterization, processing and devices. Every attempt has been made to make the articles as up-to-date as possible and assure the highest standards of accuracy. As was the case for earlier SiC books, many of the articles will be relevant a decade from now so that this book will take its place next to the earlier work as a permanent and essential reference volume.
Editors and Affiliations
Bibliographic Information
Book Title: Silicon Carbide
Book Subtitle: Recent Major Advances
Editors: W. J. Choyke, H. Matsunami, G. Pensl
Series Title: Advanced Texts in Physics
DOI: https://doi.org/10.1007/978-3-642-18870-1
Publisher: Springer Berlin, Heidelberg
-
eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2004
Hardcover ISBN: 978-3-540-40458-3Published: 08 October 2003
Softcover ISBN: 978-3-642-62333-2Published: 07 December 2012
eBook ISBN: 978-3-642-18870-1Published: 17 April 2013
Series ISSN: 1439-2674
Edition Number: 1
Number of Pages: XXXIV, 899
Topics: Electronics and Microelectronics, Instrumentation, Optical and Electronic Materials, Characterization and Evaluation of Materials, Surfaces and Interfaces, Thin Films, Condensed Matter Physics, Optics, Lasers, Photonics, Optical Devices