High-Resolution Imaging and Spectrometry of Materials

1. Front Matter

   Pages I-XIV

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2. Microcharacterisation of Materials

   • F. Ernst, W. Sigle

   Pages 1-8

3. Electron Scattering

   • H. Müller, H. Rose

   Pages 9-68

4. Structure Determination by Quantitative High-Resolution Transmission Electron Microscopy

   • G. Möbus

   Pages 69-118

5. Quantitative Analytical Transmission Electron Microscopy

   • P. Kohler-Redlich, J. Mayer

   Pages 119-187

6. Advances in Electron Optics

   • H. Rose

   Pages 189-270

7. Tomography by Atom Probe Field Ion Microscopy

   • T. Al-Kassab, H. Wollenberger, G. Schmitz, R. Kirchheim

   Pages 271-320

8. Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM)

   • H. Neddermeyer, M. Hanbücken

   Pages 321-362

9. Multi-Method High-Resolution Surface Analysis with Slow Electrons

   • E. Bauer, T. Schmidt

   Pages 363-390

10. From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites

    • J. Rödel

    Pages 391-418

11. Microstructural Characterization of Materials: An Assessment

    • R. W. Cahn, G. Ertl, J. Heydenreich

    Pages 419-433

12. Back Matter

    Pages 435-442

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The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma­ terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.

• AFM
• STM
• Transmission
• advanced electron optics
• coherent electron techniques
• composite
• electron microscopy
• electron optics
• imaging
• microscopy
• optics
• scanning probe techniques
• spectroscopy
• surface analysis
• transmission electron microscopy

• Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, USA

  Frank Ernst

• MPI für Materialforschung, Stuttgart, Germany

  Manfred Rühle

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