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X-Ray Multiple-Wave Diffraction

Theory and Application

  • Book
  • © 2004

Overview

Authors:
  1. Shih-Lin Chang

    1. Department of Physics, National Tsing Hua University, Hsinchu, Taiwan, R.O.C.

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  • Provides an overview of advanced methods in x-ray diffraction from materials
  • Suitable as advanced textbook

Part of the book series: Springer Series in Solid-State Sciences (SSSOL, volume 143)

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Table of contents (9 chapters)

  1. Front Matter

    Pages I-XII
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  2. Introduction

    • Shih-Lin Chang
    Pages 1-12

  3. Elements of X-Ray Physics and Crystallography

    • Shih-Lin Chang
    Pages 13-30

  4. Diffraction Geometry

    • Shih-Lin Chang
    Pages 31-42

  5. Experimental Techniques

    • Shih-Lin Chang
    Pages 43-69

  6. Kinematical Theory of X-Ray Diffraction

    • Shih-Lin Chang
    Pages 71-87

  7. Dynamical Theory of X-Ray Diffraction

    • Shih-Lin Chang
    Pages 89-142

  8. Theoretical Approaches

    • Shih-Lin Chang
    Pages 143-222

  9. Dynamical Diffraction Properties and Behaviors

    • Shih-Lin Chang
    Pages 223-298

  10. Applications

    • Shih-Lin Chang
    Pages 299-385

  11. Back Matter

    Pages 387-435
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Keywords

About this book

X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two­ or higher-dimensional structures, like 2-d and 3-d crystals and even quasi­ crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in­ volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X­ ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure­ ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver­ sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.

Authors and Affiliations

  • Department of Physics, National Tsing Hua University, Hsinchu, Taiwan, R.O.C.

    Shih-Lin Chang

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