Editors:
- Scientific reviews on scanning tunneling microscopy and atomic force microscopy
- Integrates basic scientific and applicational aspects
- With a foreword by the co-inventor of AFM, Christoph Gerber
- Useful reference to researchers and graduate students
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (26 chapters)
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Front Matter
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Scanning Probe Microscopy Techniques
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Front Matter
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Characterization
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Front Matter
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About this book
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber
Editors and Affiliations
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Nanoprobe Lab. Bio- & Nanotechnology &, Ohio State University, Columbus, U.S.A.
Bharat Bhushan
Bibliographic Information
Book Title: Scanning Probe Microscopy in Nanoscience and Nanotechnology
Editors: Bharat Bhushan
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-642-03535-7
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2010
Hardcover ISBN: 978-3-642-03534-0Published: 05 March 2010
Softcover ISBN: 978-3-662-50220-4Published: 23 August 2016
eBook ISBN: 978-3-642-03535-7Published: 22 January 2010
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XXX, 956
Topics: Nanotechnology, Condensed Matter Physics, Engineering, general