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Scanning Probe Microscopy in Nanoscience and Nanotechnology

  • Book
  • © 2010

Overview

Editors:
  1. Bharat Bhushan

    1. Nanoprobe Lab. Bio- & Nanotechnology &, Ohio State University, Columbus, U.S.A.

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  • Scientific reviews on scanning tunneling microscopy and atomic force microscopy
  • Integrates basic scientific and applicational aspects
  • With a foreword by the co-inventor of AFM, Christoph Gerber
  • Useful reference to researchers and graduate students

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (26 chapters)

  1. Front Matter

    Pages i-xxx
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  2. Scanning Probe Microscopy Techniques

    1. Front Matter

      Pages 1-1
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    2. Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids

      • Hendrik Hölscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Schäefer, Boris Anczykowski
      Pages 3-21

    3. Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy

      • O. M. Maragò, P. G. Gucciardi, P. H. Jones
      Pages 23-56

    4. Polarization-Sensitive Tip-Enhanced Raman Scattering

      • Pietro Giuseppe Gucciardi, Marc Lamy de La Chapelle, Jean-Christophe Valmalette, Gennaro Picardi, Razvigor Ossikovski
      Pages 57-88

    5. Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes

      • Thierry Mélin, Mariusz Zdrojek, David Brunel
      Pages 89-128

    6. Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics

      • Edward D. de Asis Jr., You Li, Alex J. Austin, Joseph Leung, Cattien V. Nguyen
      Pages 129-168

    7. Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity

      • Laurence Noirez
      Pages 169-197

    8. Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter

      • Davide Tranchida, Stefano Piccarolo
      Pages 199-223

    9. Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope

      • Yin Zhang, Kevin D Murphy
      Pages 225-257

    10. Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy

      • Martin Munz
      Pages 259-321

  3. Characterization

    1. Front Matter

      Pages 325-325
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    2. Simultaneous Topography and Recognition Imaging

      • A. Ebner, L. A. Chtcheglova, J. Preiner, J. Tang, L. Wildling, H. J. Gruber et al.
      Pages 325-362

    3. Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM

      • Noël M. Ziebarth, Felix Rico, Vincent T. Moy
      Pages 363-393

    4. Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules

      • Robert Szoszkiewicz
      Pages 395-423

    5. Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices

      • F. Consolo, F. Mastrangelo, G. Ciardelli, F. M. Montevecchi, U. Morbiducci, M. Sassi et al.
      Pages 425-486

    6. Quantized Mechanics of Nanotubes and Bundles

      • Nicola M. Pugno
      Pages 487-506

    7. Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials

      • Armen N. Kocharian, Gayanath W. Fernando, Chi Yang
      Pages 507-570

    8. Mechanical Properties of One-Dimensional Nanostructures

      • Gheorghe Stan, Robert F. Cook
      Pages 571-611

    9. Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale

      • Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri
      Pages 613-646
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Keywords

About this book

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and  typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber

Editors and Affiliations

  • Nanoprobe Lab. Bio- & Nanotechnology &, Ohio State University, Columbus, U.S.A.

    Bharat Bhushan

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