Authors:
- Presents a new technique to significantly improve in resolution and extent the applicational field of scanning electron microscopy
- Covers physics, sample preparation and technical aspects
- Offers many insights and hints based on the authors' excellent experimental experience
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Surface Sciences (SSSUR, volume 45)
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Table of contents (41 chapters)
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Front Matter
About this book
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Reviews
From the reviews:
“The book is attractively presented, in hardcover with numerous illustrations. It is a text book doing little to disguise its academic spirit discussing its subject through a series of chapters covering the technical capabilities of FE-SEM within the materials science field. … In conclusion, a well written book of interest to experienced material scientists. The book is a relevant resource for those in academic institutions and industry segments where high resolution scanning electron microscopy is employed.” (Roland A. Fleck, Infocus Magazine, Issue 21, March, 2011)Authors and Affiliations
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University Chemical Laboratory, Keio University, Yokohama, Kanagawa, Japan
Kenichi Shimizu
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Fac. Science & Technology, Central Facilities for Research, Keio University, Yokohama, Kanagawa, Japan
Tomoaki Mitani
Bibliographic Information
Book Title: New Horizons of Applied Scanning Electron Microscopy
Authors: Kenichi Shimizu, Tomoaki Mitani
Series Title: Springer Series in Surface Sciences
DOI: https://doi.org/10.1007/978-3-642-03160-1
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2010
Hardcover ISBN: 978-3-642-03159-5Published: 02 December 2009
Softcover ISBN: 978-3-642-26168-8Published: 04 May 2012
eBook ISBN: 978-3-642-03160-1Published: 19 November 2009
Series ISSN: 0931-5195
Series E-ISSN: 2198-4743
Edition Number: 1
Number of Pages: XIV, 182
Number of Illustrations: 77 b/w illustrations, 25 illustrations in colour
Topics: Surfaces and Interfaces, Thin Films, Measurement Science and Instrumentation, Solid State Physics, Spectroscopy and Microscopy, Nanotechnology, Nanotechnology and Microengineering