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Fringe 2009

6th International Workshop on Advanced Optical Metrology

  • Book
  • © 2009

Overview

Editors:
  1. Wolfgang Osten

    1. Inst. Technische Optik, Universität Stuttgart, Stuttgart, Germany

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  2. Malgorzata Kujawinska

    1. Institute of Automatic Control & Robotic, Warsaw University of Technology, Warszawa, Poland

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Table of contents (134 chapters)

  1. Front Matter

    Pages i-xxii
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  2. Key Note

    1. Front Matter

      Pages 1-1
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    2. Holography in the '60s and '70s – A View from the Fringes

      • Charles M.
      Pages 1-10

  3. Topic 1

    1. Front Matter

      Pages 1-1
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  4. Topic 1: New Methods and Tools for Data Acquisition

    1. Coherence Holography: A Thought on Synthesis and Analysis of Optical Coherence Fields

      • Mitsuo Takeda, Wei Wang, Dinesh N. Naik
      Pages 1-8

    2. The Polarization Approach in Measuring Correlation Properties of Optical Fields

      • O.V. Angelsky, C.Yu. Zenkova, N. V. Gorodyns’ka
      Pages 1-6

    3. Real-time Coherence Holography

      • Dinesh N. Naik, Takahiro Ezawa, Yoko Miyamoto, Mitsuo Takeda
      Pages 1-6

    4. Coherence and Correlation in Digital Holography

      • Ichirou Yamaguchi
      Pages 1-7

    5. Analysis of fringe formation and localization in optical interferometry using optical coherence

      • C S Narayanamurthy
      Pages 1-9

    6. Quantitative Phase Imaging in Microscopy

      • Colin JR Sheppard, Shan S Kou, Shalin Mehta
      Pages 1-7

    7. Comparison and unification of speckle-based phase retrieval and holography with applications in phasefront alignment and recognition

      • P. F. Almoro, G. Pedrini, F. Zhang, A.M.S. Maallo, A. Anand, P. N. Gundu et al.
      Pages 1-6

    8. High Precision Object Phase Reconstruction with Modified Phase Retrieval

      • Sandro Förster, Herbert Gross
      Pages 1-9

    9. Phase retrieval with an LCoS display: characterization and application

      • C. Kohler, W. Osten, F. Zhang
      Pages 1-6

    10. Digital dynamic-fringe pattern processing without frequency carrier, using wideband phase-shifting algorithmsM

      • Julio C. Estrada, Fernando Mendoza-Santoyo, Manuel de la Torre, Tonatihu Saucedo
      Pages 1-9

    11. Error-compensating phase-shifting Fizeau interferometry with a wavelength-tunable laser diode

      • Yukihiro Ishii, Sayaka Idoi, Hayato Fujita, Hideki Funamizu
      Pages 1-6

    12. Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane

      • Claas Falldorf, Reiner Klattenhoff, Achim Gesierich, Christoph v. Kopylow, Ralf Bergmann
      Pages 1-6

    13. Digital phase shifting holography and holographic interferometry

      • M. Kujawińska, N. Kumar, A. Michalkiewicz
      Pages 1-7

    14. Fourier-transform method with high accuracy by use of iterative technique narrowing the spectra of a fringe pattern

      • S. Nakayama, H. Toba, N. Fujiwara, T. Gemma, M. Takeda
      Pages 1-6

    15. Fringe pattern processing using a new adaptive and steereable asynchronous algorithm

      • J.A. Quiroga, J.A. Gómez-Pedrero, M. Servín
      Pages 1-6

    16. Synthetic Aperture Digital Holography

      • Joseph Rosen, Barak Katz
      Pages 1-5
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Keywords

About this book

21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.

Editors and Affiliations

  • Inst. Technische Optik, Universität Stuttgart, Stuttgart, Germany

    Wolfgang Osten

  • Institute of Automatic Control & Robotic, Warsaw University of Technology, Warszawa, Poland

    Malgorzata Kujawinska

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