Hardware and Software: Verification and Testing

1. Front Matter

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2. Section 1: Invited Talks

   1. Hazards of Verification

      • Daniel Jackson

      Pages 1-1

   2. Automata-Theoretic Model Checking Revisited

      • Moshe Y. Vardi

      Pages 2-2

   3. Proofs, Interpolants, and Relevance Heuristics

      • Ken McMillan

      Pages 3-3

   4. Is Verification Getting Too Complex?

      • Yoav Hollander

      Pages 4-4

   5. Can Mutation Analysis Help Fix Our Broken Coverage Metrics?

      • Brian Bailey

      Pages 5-5

   6. Practical Considerations Concerning HL-to -RT Equivalence Checking

      • Carl Pixley

      Pages 6-6

3. Section 2: Regular Papers

   1. A Framework for Inherent Vacuity

      • Dana Fisman, Orna Kupferman, Sarai Sheinvald-Faragy, Moshe Y. Vardi

      Pages 7-22

   2. A Meta Heuristic for Effectively Detecting Concurrency Errors

      • Neha Rungta, Eric G. Mercer

      Pages 23-37

   3. A Uniform Approach to Three-Valued Semantics for μ-Calculus on Abstractions of Hybrid Automata

      • Kerstin Bauer, Raffaella Gentilini, Klaus Schneider

      Pages 38-52

   4. Automatic Boosting of Cross-Product Coverage Using Bayesian Networks

      • Dorit Baras, Laurent Fournier, Avi Ziv

      Pages 53-67

   5. Efficient Decision Procedure for Bounded Integer Non-linear Operations Using SMT(\(\mathcal{LIA}\))

      • Malay K. Ganai

      Pages 68-83

   6. Evaluating Workloads Using Comparative Functional Coverage

      • Yoram Adler, Dale Blue, Thomas Conti, Richard Prewitt, Shmuel Ur

      Pages 84-98

   7. Iterative Delta Debugging

      • Cyrille Artho

      Pages 99-113

   8. Linear-Time Reductions of Resolution Proofs

      • Omer Bar-Ilan, Oded Fuhrmann, Shlomo Hoory, Ohad Shacham, Ofer Strichman

      Pages 114-128

   9. Significant Diagnostic Counterexamples in Probabilistic Model Checking

      • Miguel E. Andrés, Pedro D’Argenio, Peter van Rossum

      Pages 129-148

   10. Statistical Model Checking of Mixed-Analog Circuits with an Application to a Third Order Δ − Σ Modulator

       • Edmund Clarke, Alexandre Donzé, Axel Legay

       Pages 149-163

   11. Structural Contradictions

       • Cindy Eisner, Dana Fisman

       Pages 164-178

   12. Synthesizing Test Models from Test Cases

       • Antti Jääskeläinen, Antti Kervinen, Mika Katara, Antti Valmari, Heikki Virtanen

       Pages 179-193

4. Section 3: Tool Papers

   1. d-TSR: Parallelizing SMT-Based BMC Using Tunnels over a Distributed Framework

      • Malay K. Ganai, Weihong Li

      Pages 194-199

These are the conference proceedings of the 4th Haifa Veri?cation Conference, held October 27–30, 2008 in Haifa, Israel. This international conference is a unique venue that brings together leading researchers and practitioners of both formal and dynamic veri?cation, for both hardware and software systems. This year’s conference extended the successes of the previous years, with a largejumpinthenumberofsubmitted papers. Wereceived49totalsubmissions, with many more high-quality papers than we had room to accept. Submissions came from 19 di?erent countries, re?ecting the growing international visibility of the conference. Of the 49 submissions, 43 were regular papers, 2 of which were later withdrawn, and 6 were tool papers. After a rigorous review process, in which each paper received at least four independent reviews from the dist- guished Program Committee, we accepted 12 regular papers and 4 tools papers for presentation at the conference and inclusion in this volume. These numbers give acceptance rates of 29% for regular papers and 67% for tool papers (34% combined) — comparable to the elite, much older, conferences in the ?eld. A Best Paper Award, selected on the basis of the reviews and scores from the Program Committee, was presented to Edmund Clarke, Alexandre Donz´ e, and AxelLegayfortheirpaperentitled“StatisticalModelCheckingofMixed-Analog Circuits with an Application to a Third-Order Delta-Sigma Modulator. ” The refereed program was complemented by an outstanding program of - vited talks, panels, and special sessions from prominent leaders in the ?eld.

• automated verification tools
• automatic test generation
• concurrency testing
• concurrency verification
• debugging
• design for verifiability
• developer testing
• equivalence checking
• functional verification
• hybrid verification methods
• meta-heuristics
• mo

• IBM Haifa Labs, Haifa University Campus, Mount Carmel, Haifa, Israel

  Hana Chockler

• Department of Computer Science, University of British Columbia, Vancouver, Canada

  Alan J. Hu

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