Overview
- Successful and highly acclaimed text
- Designed to meet the needs of materials scientists, including students, teachers and researchers
- Can be used as both an introductory and advanced level graduate text
- Chapters are sorted according to difficulty and grouped for use in quarter and semester courses
- Problems for the student are appended to each chapter
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Table of contents (12 chapters)
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Front Matter
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Back Matter
Keywords
About this book
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.''
John Hutchison in Journal of Microscopy
``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.''
Ray Egerton in Micron
``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.''
John C. H. Spence, Arizona State University
``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’
Colin Humphreys, Cambridge University
``This text offers the most complete pedagogical treatment of scattering theory available in a single source for graduate instruction in contemporary materials characterization. Its integration of photons and electrons, beam lines and electron microscopes, theory and practice, assists students with diverse scientific and technical backgrounds to understand the essence of diffraction, spectrometry and imaging. Highly recommended.’’
Ronald Gronsky, University of California, Berkeley
Authors and Affiliations
Bibliographic Information
Book Title: Transmission Electron Microscopy and Diffractometry of Materials
Authors: Brent Fultz, James M. Howe
DOI: https://doi.org/10.1007/978-3-540-73886-2
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2008
eBook ISBN: 978-3-540-73886-2Published: 04 November 2007
Edition Number: 3
Number of Pages: XX, 758
Number of Illustrations: 440 b/w illustrations
Topics: Characterization and Evaluation of Materials, Surfaces and Interfaces, Thin Films, Crystallography and Scattering Methods, Solid State Physics, Spectroscopy and Microscopy, Engineering, general