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  • Conference proceedings
  • © 2007

Formal Methods: Applications and Technology

11th International Workshop on Formal Methods for Industrial Critical Systems, FMICS 2006, and 5th International Workshop on Parallel and Distributed Methods in Verification, PDMC 2006, Bonn, Germany, August 26-27, and August 31, 2006, Revised Selected

Part of the book series: Lecture Notes in Computer Science (LNCS, volume 4346)

Part of the book sub series: Programming and Software Engineering (LNPSE)

Conference series link(s): PDMC: International Workshop on Parallel and Distributed Methods in Verification

Conference proceedings info: PDMC 2006.

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Table of contents (24 papers)

  1. Front Matter

  2. FMICS

    1. Discovering Symmetries

      • Hassen Saïdi
      Pages 67-83
    2. On Combining Partial Order Reduction with Fairness Assumptions

      • Luboš Brim, Ivana Černá, Pavel Moravec, Jiří Šimša
      Pages 84-99
    3. Test Coverage for Loose Timing Annotations

      • C. Helmstetter, F. Maraninchi, L. Maillet-Contoz
      Pages 100-115
    4. Model-Based Testing of a WAP Gateway: An Industrial Case-Study

      • Anders Hessel, Paul Pettersson
      Pages 116-131
    5. Heuristics for ioco-Based Test-Based Modelling

      • Tim A. C. Willemse
      Pages 132-147
    6. Verifying VHDL Designs with Multiple Clocks in SMV

      • A. Smrčka, V. Řehák, T. Vojnar, D. Šafránek, P. Matoušek, Z. Řehák
      Pages 148-164
    7. Verified Design of an Automated Parking Garage

      • Aad Mathijssen, A. Johannes Pretorius
      Pages 165-180
    8. Evaluating Quality of Service for Service Level Agreements

      • Allan Clark, Stephen Gilmore
      Pages 181-194
    9. Blasting Linux Code

      • Jan Tobias Mühlberg, Gerald Lüttgen
      Pages 211-226
    10. A Finite State Modeling of AFDX Frame Management Using Spin

      • Indranil Saha, Suman Roy
      Pages 227-243
    11. Automated Incremental Synthesis of Timed Automata

      • Borzoo Bonakdarpour, Sandeep S. Kulkarni
      Pages 261-276
    12. SAT-Based Verification of LTL Formulas

      • Wenhui Zhang
      Pages 277-292

Other Volumes

  1. Formal Methods: Applications and Technology

About this book

These are the joint ?nal proceedings of the 11th International Workshop on Formal Methods for Industrial Critical Systems (FMICS 2006) and the ?fth International Workshop on Parallel and Distributed Methods in Veri?cation (PDMC 2006). Both workshops were organized as satellite events of CONCUR 2006, the 17th International Conference on Concurrency Theory that was or- nized in Bonn, August 2006. The FMICS workshop continued successfully the aim of the FMICS working group – to promote the use of formal methods for industrial applications, by supporting research in this area and its application in industry. The emphasis in these workshops is on the exchange of ideas between researchers and prac- tioners, in both industry and academia. This year the Program Committee received a record number of submissions. The 16 accepted regular contributions and 2 accepted tool papers, selected out of a total of 47 submissions, cover formal methodologies for handling large state spaces, model-based testing, formal description and analysis techniques as well as a range of applications and case studies. The workshop program included two invited talks, by Anna Slobodova from Intel on “Challenges for Formal Veri?cation in an Industrial Setting” and by Edward A. Lee from the University of California at Berkeley on “Making C- currency Mainstream.” The former full paper can be found in this volume.

Reviews

From the reviews:

"This collection includes papers on various areas in the discipline of formal methods, including formal verification and validation in both hardware and software. … The main contribution of this book revolves around the careful selection of high-quality papers that include both industrial and academic case studies. This book also covers critical areas of formal methods … . This book … could be used as a reference for courses covering various aspects of formal methods and testing." (Hassan Reza, ACM Computing Reviews, Vol. 49 (8), August, 2008)

Bibliographic Information

Buy it now

Buying options

eBook USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access