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Surface Scattering Experiments with Conduction Electrons

  • Book
  • © 1993

Overview

Part of the book series: Springer Tracts in Modern Physics (STMP, volume 128)

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Table of contents (6 chapters)

Keywords

About this book

Surface Scattering Experiments with Conduction Electrons shows how this process can be used to investigate surface processes of thin metal films. Since a thin film is in one direction of a size comparable to the mean free path of the conduction electrons, such a film is both substrate and sensor and must be characterized by other surface-analytical methodsas demonstrated here. Also discussed is how the dc-resistivity measurement permits the study of surface processes such as adsorption, desorption, and surface diffusion up to crystalline growth. The in situ observation of epitaxial growth is additionally shown to be possible. Thus the electronic structure of superimposed metal films and superlattices can be elucidated. This is an essential topic for all surface physicists.

Authors and Affiliations

  • Lehrstuhl für Oberflächenwissenschaft, Heinrich-Heine-Universität Düsseldorf, Düsseldorf 1, Germany

    Dieter Schumacher

Bibliographic Information

  • Book Title: Surface Scattering Experiments with Conduction Electrons

  • Authors: Dieter Schumacher

  • Series Title: Springer Tracts in Modern Physics

  • DOI: https://doi.org/10.1007/BFb0107230

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1993

  • Softcover ISBN: 978-3-662-14947-8Published: 03 October 2013

  • eBook ISBN: 978-3-540-47474-6Published: 17 September 2007

  • Series ISSN: 0081-3869

  • Series E-ISSN: 1615-0430

  • Edition Number: 1

  • Number of Pages: IX, 97

  • Number of Illustrations: 11 b/w illustrations

  • Topics: Surfaces and Interfaces, Thin Films

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