Authors:
- This book is the first one on anomalous X-ray scattering
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Tracts in Modern Physics (STMP, volume 179)
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Table of contents (10 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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Institute for Advanced Materials Processing, Tohoku University, Sendai, Japan
Yoshio Waseda
Bibliographic Information
Book Title: Anomalous X-Ray Scattering for Materials Characterization
Book Subtitle: Atomic-Scale Structure Determination
Authors: Yoshio Waseda
Series Title: Springer Tracts in Modern Physics
DOI: https://doi.org/10.1007/3-540-46008-X
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2002
Hardcover ISBN: 978-3-540-43443-6Published: 11 September 2002
Softcover ISBN: 978-3-662-14637-8Published: 03 October 2013
eBook ISBN: 978-3-540-46008-4Published: 01 July 2003
Series ISSN: 0081-3869
Series E-ISSN: 1615-0430
Edition Number: 1
Number of Pages: XIV, 214
Topics: Surfaces and Interfaces, Thin Films, Characterization and Evaluation of Materials