Overview
- Up-to-date review
- Comprehensive overview: theory and experiment
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Tracts in Modern Physics (STMP, volume 199)
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Table of contents (9 chapters)
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Front Matter
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Back Matter
Keywords
About this book
This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
Authors and Affiliations
Bibliographic Information
Book Title: X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
Authors: Martin Schmidbauer
Series Title: Springer Tracts in Modern Physics
DOI: https://doi.org/10.1007/b13608
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 2004
Hardcover ISBN: 978-3-540-20179-3Published: 09 January 2004
Softcover ISBN: 978-3-642-05769-4Published: 01 December 2010
eBook ISBN: 978-3-540-39986-5Published: 26 November 2003
Series ISSN: 0081-3869
Series E-ISSN: 1615-0430
Edition Number: 1
Number of Pages: X, 204
Topics: Classical Electrodynamics, Atomic, Molecular, Optical and Plasma Physics, Optical and Electronic Materials, Condensed Matter Physics