X-Ray Microscopy II

1. Front Matter

   Pages I-XIV

   PDF

2. Introduction

   1. Introduction

      • D. Sayre, M. Howells, J. Kirz, H. Rarback

      Pages 1-2

3. X-Ray Sources

   1. Front Matter

      Pages 3-3

      PDF

   2. Experience with Synchrotron Radiation Sources

      • S. Krinsky

      Pages 4-9

   3. The NSLS Mini-Undulator

      • H. Rarback, C. Jacobson, J. Kirz, I. McNulty

      Pages 10-15

   4. Partial Coherence and Spectral Brightness at X-Ray Wavelengths

      • D. Attwood, Kwang-Je Kim

      Pages 16-21

   5. A Plasma Focus as Radiation Source for a Laboratory X-Ray Microscope

      • W. Neff, J. Eberle, R. Holz, F. Richter, R. Lebert

      Pages 22-29

   6. Lawrence Livermore National Laboratory Soft X-Ray Laser Program

      • J. Trebes, S. Brown, E. M. Campbell, N. M. Ceglio, D. Eder, D. Gaines et al.

      Pages 30-35

   7. X-Ray Laser Sources for Microscopy

      • C. H. Skinner, D. E. Kim, A. Wouters, D. Voorhees, S. Suckewer

      Pages 36-42

   8. Laser Plasma Soft X-Ray Source: A Dedicated Small Source at the Central Laser Facility

      • A. Damerell, E. Madraszek, F. O’Neill, N. Rizvi, R. Rosser, P. Rumsby

      Pages 43-45

   9. Soft X-Ray Laser Microscopy

      • D. DiCicco, L. Meixler, C. H. Skinner, S. Suckewer, J. Hirschberg, E. Kohen

      Pages 46-49

   10. Laser Plasma Soft X-Ray Sources: Overcoming the Debris Problem by Means of Relay Optics

       • C. Hills, R. Feder, A. Ng, R. Rosser, R. Speer

       Pages 50-53

   11. Status of the Taiwan Light Source

       • Gwo-Jen Jan

       Pages 54-58

   12. The Potential of Laser Plasma Sources in Scanning X-Ray Microscopy

       • A. G. Michette, R. E. Burge, A. M. Rogoyski, F. O’Neill, I. C. E. Turcu

       Pages 59-62

   13. Future Plans for X-Ray Microscopy at the SRS

       • H. A. Padmore, P. J. Duke, R. E. Burge, A. G. Michette

       Pages 63-67

4. X-Ray Optics and Components

   1. Front Matter

      Pages 69-69

      PDF

   2. Theoretical Investigations of Imaging Properties of Zone Plates Using Diffraction Theory

      • J. Thieme

      Pages 70-79

   3. Microzone Plate Fabrication by 100 keV Electron Beam Lithography

      • V. Bögli, P. Unger, H. Beneking, B. Greinke, P. Guttmann, B. Niemann et al.

      Pages 80-87

   4. Zone Plates for Scanning X-Ray Microscopy: Contamination Writing and Efficiency Enhancement

      • C. J. Buckley, M. T. Browne, R. E. Burge, P. Charalambous, K. Ogawa, T. Takeyoshi

      Pages 88-94

   5. Phase Zone Plates for the Göttingen X-Ray Microscopes

      • R. Hilkenbach, J. Thieme, P. Guttmann, B. Niemann

      Pages 95-101

This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub­ ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im­ portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre­ sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou­ bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con­ tributions and for their efforts in adhering to the guidelines on manuscript preparation.

• Absorption
• X-ray
• coherence
• development
• diffraction
• growth
• holography
• image processing
• laser
• microscopy
• optics
• preparation
• quality
• scattering
• synchrotron radiation

• IBM T.J. Watson Research Center, Yorktown Heights, USA

  David Sayre

• Department of Physics, State University of New York, Stony Brook, USA

  Janos Kirz

• Center for X-Ray Optics, Lawrence Berkeley Laboratory, University of California at Berkeley, Berkeley, USA

  Malcolm Howells

• National Synchrotron Light Source, Brookhaven National Laboratory, Upton, USA

  Harvey Rarback

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